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FQP9N30 Datasheet, PDF (5/8 Pages) Fairchild Semiconductor – 300V N-Channel MOSFET
Gate Charge Test Circuit & Waveform
Same Type
VGS
50KΩ
as DUT
Qg
12V
200nF
300nF
10V
VGS
VDS
Qgs
Qgd
DUT
3mA
Charge
Resistive Switching Test Circuit & Waveforms
10V
VDS
VGS
RG
RL
VDD
DUT
VDS
90%
VGS 10%
td(on)
tr
t on
td(off)
tf
t off
10V
tp
Unclamped Inductive Switching Test Circuit & Waveforms
VDS
ID
RG
L
EAS
=
--1--
2
L IAS2
BVDSS
--------------------
BVDSS - VDD
BVDSS
IAS
VDD
ID (t)
DUT
VDD
VDS (t)
tp
Time
©2000 Fairchild Semiconductor International
Rev. A, May 2000