FOD3180_08 Datasheet, PDF (5/13 Pages) Fairchild Semiconductor – 2A Output Current, High Speed MOSFET Gate Driver Optocoupler

Notes:
1. Derate linearly above +70°C free air temperature at a rate of 0.3mA/°C.
2. The output currents I_OH and I_OL are specified with a capacitive current limited load = (3 x 0.01µF) + 0.5Ω,
frequency = 8kHz, 50% DF.
3. The output currents I_OH and I_OL are specified with a capacitive current limited load = (3 x 0.01µF) + 8.5Ω,
frequency = 8kHz, 50% DF.
4. Derate linearly above +87°C, free air temperature at the rate of 0.77mW/°C. Refer to Figure 12.
5. No derating required across operating temperature range.
6. In this test, V_OH is measured with a dc load current of 100mA. When driving capacitive load V_OH will approach V_CC
as I_OH approaches zero amps.
7. Maximum pulse width = 1ms, maximum duty cycle = 20%.
8. t_PHL propagation delay is measured from the 50% level on the falling edge of the input pulse to the 50% level of the
falling edge of the V_O signal. t_PLH propagation delay is measured from the 50% level on the rising edge of the input
pulse to the 50% level of the rising edge of the V_O signal.
9. PWD is defined as | t_PHL – t_PLH | for any given device.
10. The difference between t_PHL and t_PLH between any two FOD3180 parts under same test conditions.
11. Pin 1 and 4 need to be connected to LED common.
12. Common mode transient immunity in the high state is the maximum tolerable dV_CM/dt of the common mode pulse
V_CM to assure that the output will remain in the high state (i.e. V_O > 10.0V).
13. Common mode transient immunity in a low state is the maximum tolerable dV_CM/dt of the common mode pulse,
V_CM, to assure that the output will remain in a low state (i.e. V_O < 1.0V).
14. In accordance with UL 1577, each optocoupler is proof tested by applying an insulation test voltage > 6000Vrms,
60Hz for 1 second (leakage detection current limit I_I-O < 5µA).
15. Device considered a two-terminal device: pins on input side shorted together and pins on output side shorted
together.
©2005 Fairchild Semiconductor Corporation
FOD3180 Rev. 1.0.6
5
www.fairchildsemi.com