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FOD2742A_08 Datasheet, PDF (5/15 Pages) Fairchild Semiconductor – Optically Isolated Error Amplifier
Electrical Characteristics (TA = 25°C unless otherwise specified) (Continued)
Output Characteristics
Symbol
Parameter
Test Conditions
Min.
ICEO
Collector Dark Current
VCE = 10V (Fig. 5)
BVECO Emitter-Collector Voltage
IE = 100µA
7
Breakdown
BVCEO Collector-Emitter Voltage
IC = 1.0mA
70
Breakdown
Typ.
1
10
120
Max.
50
Unit
nA
V
V
Transfer Characteristics
Symbol
Parameter
CTR Current Transfer Ratio
VCE (SAT) Collector-Emitter
Saturation Voltage
Test Conditions
ILED = 10mA, VCOMP = VFB,
VCE = 5V (Fig. 6)
ILED = 10mA, VCOMP = VFB,
IC = 2.5mA (Fig. 6)
Min.
100
Typ.
140
Max.
200
Unit
%
0.16 0.4
V
Isolation Characteristics
Symbol
Parameter
Test Conditions
II-O
VISO
RI-O
Input-Output Insulation
Leakage Current
Withstand Insulation Voltage
Resistance (Input to Output)
RH = 45%, TA = 25°C, t = 5s,
VI-O = 3000 VDC (Note 1)
RH ≤ 50%, TA = 25°C,
t = 1 min. (Note 1)
VI-O = 500 VDC (Note 1)
Min.
Typ.
Max.
1.0
Unit
µA
2500
1012
Vrms
Ω
Switching Characteristics
Symbol
Parameter
BW
CMH
CML
Bandwidth
Common Mode Transient
Immunity at Output HIGH
Common Mode Transient
Immunity at Output LOW
Test Conditions
Fig. 7
ILED = 0mA, Vcm = 10 VPP
RL = 2.2kΩ (Fig. 8) (Note 2)
ILED = 10mA, Vcm = 10 VPP
RL = 2.2kΩ (Fig. 8) (Note 2)
Min.
Typ.
50
1.0
Max.
Unit
kHz
kV/µs
1.0
kV/µs
Notes:
1. Device is considered as a two terminal device: Pins 1, 2, 3 and 4 are shorted together and Pins 5, 6, 7 and 8 are
shorted together.
2. Common mode transient immunity at output high is the maximum tolerable (positive) dVcm/dt on the leading edge
of the common mode impulse signal, Vcm, to assure that the output will remain high. Common mode transient
immunity at output low is the maximum tolerable (negative) dVcm/dt on the trailing edge of the common pulse
signal,Vcm, to assure that the output will remain low.
©2003 Fairchild Semiconductor Corporation
FOD2742A, FOD2742B, FOD2742C Rev. 1.0.0
5
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