FOD2711_08 Datasheet, PDF (5/15 Pages) Fairchild Semiconductor – Optically Isolated Error Amplifier

Electrical Characteristics (Continued) (T_A = 25°C unless otherwise specified)
Isolation Characteristics
Symbol
Parameter
Test Conditions
Min.
I_I-O
V_ISO
R_I-O
Input-Output Insulation
Leakage Current
Withstand Insulation
Voltage
Resistance (Input to Output)
RH = 45%, T_A = 25°C, t = 5s,
V_I-O = 3000 VDC⁽⁶⁾
RH ≤ 50%, T_A = 25°C, t = 1 min.⁽⁶⁾
V_I-O = 500 VDC⁽⁶⁾
5000
Typ.
10¹²
Max.
1.0
Unit
µA
Vrms
Ω
Switching Characteristics
Symbol
Parameter
BW
CMH
CML
Bandwidth
Common Mode Transient
Immunity at Output HIGH
Common Mode Transient
Immunity at Output LOW
Test Conditions
(Fig. 7)
I_LED = 0mA, Vcm = 10 V_PP,
R_L = 2.2kΩ⁽⁷⁾ (Fig. 8)
I_LED = 1mA, Vcm = 10 V_PP,
R_L = 2.2kΩ⁽⁷⁾ (Fig. 8)
Min.
Typ.
10
1.0
Max.
Unit
kHZ
kV/µs
1.0
kV/µs
Notes:
6. Device is considered as a two terminal device: Pins 1, 2, 3 and 4 are shorted together and Pins 5, 6, 7 and 8 are shorted
together.
7. Common mode transient immunity at output high is the maximum tolerable (positive) dVcm/dt on the leading edge
of the common mode impulse signal, Vcm, to assure that the output will remain high. Common mode transient
immunity at output low is the maximum tolerable (negative) dVcm/dt on the trailing edge of the common pulse
signal,Vcm, to assure that the output will remain low.
©2003 Fairchild Semiconductor Corporation
FOD2711 Rev. 1.0.1
5
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