English
Language : 

74ACQ240_07 Datasheet, PDF (5/11 Pages) Fairchild Semiconductor – Quiet Series™ Octal Buffer/Line Driver with 3-STATE Outputs
DC Electrical Characteristics for ACTQ
Symbol
Parameter
VIH Minimum HIGH Level
Input Voltage
VIL Maximum LOW Level
Input Voltage
VOH Minimum HIGH Level
Output Voltage
VOL Maximum LOW Level
Output Voltage
IIN
IOZ
ICCT
IOLD
IOHD
ICC
VOLP
VOLV
VIHD
VILD
Maximum Input
Leakage Current
Maximum 3-STATE
Leakage Current
Maximum ICC/Input
Minimum Dynamic
Output Current(7)
Maximum Quiescent
Supply Current
Quiet Output Maximum
Dynamic VOL
Quiet Output Minimum
Dynamic VOL
Minimum HIGH Level
Dynamic Input Voltage
Maximum LOW Level
Dynamic Input Voltage
VCC (V) Conditions
4.5 VOUT = 0.1V or
5.5 VCC – 0.1V
4.5 VOUT = 0.1V or
5.5 VCC – 0.1V
4.5 IOUT = –50µA
5.5
VIN = VIL or VIH:
4.5 IOH = –24mA
5.5 IOH = –24mA(6)
4.5 IOUT = 50µA
5.5
VIN = VIL or VIH:
4.5 IOL = 24mA
5.5 IOL = 24mA(6)
5.5 VI = VCC, GND
TA = +25°C TA = –40°C to +85°C
Typ.
Guaranteed Limits
Units
1.5 2.0
2.0
V
1.5 2.0
2.0
1.5 0.8
0.8
V
1.5 0.8
0.8
4.49 4.4
4.4
V
5.49 5.4
5.4
3.86
3.76
4.86
4.76
0.001 0.1
0.1
V
0.001 0.1
0.1
0.36
0.44
0.36
0.44
±0.1
±1.0
µA
5.5 VI = VIL, VIH;
±0.25
±2.5
µA
VO = VCC, GND
5.5 VI = VCC – 2.1V
0.6
1.5
mA
5.5 VOLD = 1.65V Max.
75
mA
5.5 VOHD = 3.85V Min.
–75
mA
5.5 VIN = VCC or GND
4.0
40.0
µA
5.0 Figures 1 & 2(8)
1.1 1.5
V
5.0 Figures 1 & 2(8)
–0.6 –1.2
V
5.0 (9)
1.9 2.2
V
5.0 (9)
1.2 0.8
V
Notes:
6. All outputs loaded; thresholds on input associated with output under test.
7. Maximum test duration 2.0ms, one output loaded at a time.
8. Max number of Data Inputs defined as (n). n–1 Data Inputs are driven 0V to 3V. One Data Input @ VIN = GND.
9. Max number of Data Inputs (n) switching. (n–1) Inputs switching 0V to 3V (ACTQ). Input-under-test switching:
3V to threshold (VILD), 0V to threshold (VIHD), f = 1 MHz.
©1989 Fairchild Semiconductor Corporation
74ACQ240, 74ACTQ240 Rev. 1.6
5
www.fairchildsemi.com