FOD3181_08 Datasheet, PDF (4/12 Pages) Fairchild Semiconductor – 0.5A Ouput Current, High Speed MOSFET Gate Driver Optocoupler

Notes:
1. Derate linearly above +70°C free air temperature at a rate of 0.3mA/°C.
2. The output currents I_OH and I_OL are specified with a capacitive current limited load = (3 x 0.01µF) + 0.5Ω,
frequency = 8kHz, 50% DF.
3. The output currents I_OH and I_OL are specified with a capacitive current limited load = (3 x 0.01µF) + 40Ω,
frequency = 8kHz, 50% DF.
4. No derating required across operating temperature range.
5. In this test, V_OH is measured with a dc load current of 100mA. When driving capacitive load V_OH will approach V_CC
as I_OH approaches zero amps.
6. Maximum pulse width = 1ms, maximum duty cycle = 20%.
7. t_PHL propagation delay is measured from the 50% level on the falling edge of the input pulse to the 50% level of the
falling edge of the V_O signal. t_PLH propagation delay is measured from the 50% level on the rising edge of the input
pulse to the 50% level of the rising edge of the V_O signal.
8. Pin 1 and 4 need to be connected to LED common.
9. Common mode transient immunity in the high state is the maximum tolerable dV_CM/ dt of the common mode pulse
V_CM to assure that the output will remain in the high state (i.e. V_O > 10.0V).
10. Common mode transient immunity in a low state is the maximum tolerable dV_CM/ dt of the common mode pulse,
V_CM, to assure that the output will remain in a low state (i.e. V_O < 1.0V).
11. In accordance with UL 1577, each optocoupler is proof tested by applying an insulation test voltage > 6000Vrms,
60Hz for 1 second (leakage detection current limit I_I-O < 5µA).
12. Device considered a two-terminal device: pins on input side shorted together and pins on output side shorted
together.
©2003 Fairchild Semiconductor Corporation
FOD3181 Rev. 1.0.8
4
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