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| FOD2712 Datasheet, PDF (4/13 Pages) Fairchild Semiconductor – OPTICALLY ISOLATED ERROR AMPLIFIER | |||
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OPTICALLY ISOLATED
ERROR AMPLIFIER
FOD2712
OUTPUT CHARACTERISTICS (TA = 25°C Unless otherwise speciï¬ed.)
Parameter
Test Conditions Symbol
Min
Typ
Max
Unit
Collector dark current
Collector-emitter voltage breakdown
Emitter-collector voltage breakdown
(VCE = 10 V) (Fig. 5)
ICEO
(IC = 1.0mA) BVCEO
70
(IE = 100 µA) BVECO
7
50
nA
V
V
TRANSFER CHARACTERISTICS (TA = 25°C Unless otherwise speciï¬ed.)
Parameter
Test Conditions Symbol Min
Typ
Max
Unit
Current transfer ratio
Collector-emitter
saturation voltage
(ILED = 10 mA, VCOMP = VFB,
VCE = 5 V) (Fig. 6)
CTR
100
(ILED = 10 mA, VCOMP = VFB,
IC = 2.5 mA) (Fig. 6)
VCE (SAT)
200
%
0.4
V
ISOLATION CHARACTERISTICS (TA = 25°C Unless otherwise speciï¬ed.)
Parameter
Test Conditions Symbol Min
Typ
Input-output insulation
leakage current
Withstand insulation
voltage
Resistance (input to output)
(RH = 45%, TA = 25°C, t = 5s,
VI-O = 3000 VDC) (note. 1)
(RH <= 50%, TA = 25°C, t = 1 min)
(notes. 1)
VI-O = 500 VDC (note. 1)
II-O
VISO
RI-O
2500
1012
Max
Unit
1.0
µA
Vrms
Ohm
SWITCHING CHARACTERISTICS (TA = 25°C Unless otherwise speciï¬ed.)
Parameter
Test Conditions Symbol Min
Typ
Bandwidth
(Fig. 7) BW
10
Common mode transient
immunity at output high
(ILED = 0 mA, Vcm = 10 VPP CMH
RL = 2.2 k⦠(Fig. 8) (note. 2)
1.0
Common mode transient
immunity at output low
(ILED = 10 mA, Vcm = 10 VPP
RL = 2.2 k⦠(Fig. 8) (note. 2)
CML
1.0
Max
Unit
kHZ
kV/µs
kV/µs
Notes
1. Device is considered as a two terminal device: Pins 1, 2, 3 and 4 are shorted together and Pins 5, 6, 7 and 8 are shorted together.
2. Common mode transient immunity at output high is the maximum tolerable (positive) dVcm/dt on the leading edge of the
common mode impulse signal, Vcm, to assure that the output will remain high. Common mode transient immunity at output low
is the maximum tolerable (negative) dVcm/dt on the trailing edge of the common pulse signal,Vcm, to assure that the output will
remain low.
© 2003 Fairchild Semiconductor Corporation
Page 4 of 13
4/10/03
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