74ACQ574 Datasheet, PDF (4/10 Pages) Fairchild Semiconductor – Quiet Series™ Octal D-Type Flip-Flop with 3-STATE Outputs

DC Electrical Characteristics for ACQ (Continued)
Symbol
Parameter
V_CC
T_A = +25°C
T_A = −40°C to +85°C
Units
(V)
Typ
Guaranteed Limits
V_OLP
Quiet Output
5.0
1.1
1.5
V
Maximum Dynamic V_OL
V_OLV
Quiet Output
5.0
−0.6
−1.2
V
Minimum Dynamic V_OL
V_IHD
Minimum HIGH Level
5.0
3.1
3.5
V
Dynamic Input Voltage
V_ILD
Maximum LOW Level
5.0
1.9
1.5
V
Dynamic Input Voltage
Note 2: All outputs loaded; thresholds on input associated with output under test.
Note 3: Maximum test duration 2.0 ms, one output loaded at a time.
Note 4: I_IN and I_CC @ 3.0V are guaranteed to be less than or equal to the respective limit @ 5.5V V_CC.
Note 5: DIP package.
Note 6: Max number of outputs defined as (n). Data inputs are driven 0V to 5V. One output @ GND.
Note 7: Maximum number of data inputs (n) switching. (n−1) inputs switching 0V to 5V (ACQ). Input-under-test switching:
5V to threshold (V_ILD), 0V to threshold (V_IHD). f = 1 MHz.
Conditions
Figure 1, Figure 2
(Note 5)(Note 6)
Figure 1, Figure 2
(Note 5)(Note 6)
(Note 5)(Note 7)
(Note 5)(Note 7)
DC Electrical Characteristics for ACTQ
Symbol
Parameter
V_IH
Minimum HIGH Level
Input Voltage
V_IL
Maximum LOW Level
Input Voltage
V_OH
Minimum HIGH Level
Output Voltage
V_CC
T_A = +25°C
T_A = −40°C to +85°C
(V)
Typ
Guaranteed Limits
4.5
1.5
2.0
2.0
5.5
1.5
2.0
2.0
4.5
1.5
0.8
0.8
5.5
1.5
0.8
0.8
4.5
4.49
4.4
4.4
5.5
5.49
5.4
5.4
V_OL
Maximum LOW Level
Output Voltage
4.5
3.85
3.76
5.5
4.86
4.76
4.5
0.001
0.1
0.1
5.5
0.001
0.1
0.1
4.5
0.36
0.44
5.5
0.36
0.44
I_IN
Maximum Input Leakage Current 5.5
I_OZ
Maximum 3-STATE
5.5
Leakage Current
±0.1
±1.0
±0.25
±2.5
I_CCT
Maximum I_CC/Input
5.5
0.6
1.5
I_OLD
Minimum Dynamic
5.5
75
I_OHD
Output Current (Note 9)
5.5
−75
I_CC
Maximum Quiescent
5.5
Supply Current
4.0
40.0
V_OLP
V_OLV
V_IHD
Quiet Output
Maximum Dynamic V_OL
Quiet Output
Minimum Dynamic V_OL
Minimum HIGH Level
Dynamic Input Voltage
5.0
1.1
1.5
5.0
−0.6
−1.2
5.0
1.9
2.2
V_ILD
Maximum LOW Level
Dynamic Input Voltage
5.0
1.2
0.8
Note 8: All outputs loaded; thresholds on input associated with output under test.
Note 9: Maximum test duration 2.0 ms, one output loaded at a time.
Note 10: DIP package.
Note 11: Max number of outputs defined as (n). Data inputs are driven 0V to 3V. One output @ GND.
Units
Conditions
V
V_OUT = 0.1V
or V_CC − 0.1V
V
V_OUT = 0.1V
or V_CC − 0.1V
V
I_OUT = −50 µA
V_IN = V_IL or V_IH
V
I_OH= −24 mA
I_OH= −24 mA (Note 8)
V
I_OUT = 50 µA
V_IN = V_IL or V_IH
V
I_OL = 24 mA
I_OL = 24 mA (Note 8)
µA
V_I = V_CC, GND
µA
V_I = V_IL, V_IH
V_O = V_CC, GND
mA V_I = V_CC − 2.1V
mA V_OLD = 1.65V Max
mA V_OHD = 3.85V Min
µA
V_IN = V_CC
or GND
Figure 1, Figure 2
V
(Note 10)(Note 11)
Figure 1, Figure 2
V
(Note 10)(Note 11)
V
(Note 10)(Note 12)
V
(Note 10)(Note 12)
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