74AC00SCX Datasheet, PDF (4/10 Pages) Fairchild Semiconductor – Quad 2-Input NAND Gate

DC Electrical Characteristics for ACT
Symbol
Parameter
V_IH Minimum HIGH Level
Input Voltage
V_IL Maximum LOW Level
Input Voltage
V_OH Minimum HIGH Level
Output Voltage
V_OL Maximum LOW Level
Output Voltage
I_IN
I_CCT
I_OLD
I_OHD
I_CC
Maximum Input
Leakage Current
Maximum I_CC/Input
Minimum Dynamic
Output Current⁽⁵⁾
Maximum Quiescent
Supply Current
V_CC
(V)
4.5
5.5
4.5
5.5
4.5
5.5
4.5
5.5
4.5
5.5
4.5
5.5
5.5
Conditions
V_OUT = 0.1V or
V_CC – 0.1V
V_OUT = 0.1V or
V_CC – 0.1V
I_OUT = –50µA
V_IN = V_IL or V_IH,
I_OH = –24mA
V_IN = V_IL or V_IH,
I_OH = –24mA⁽⁴⁾
I_OUT = 50µA
V_IN = V_IL or V_IH,
I_OL = 24mA
V_IN = V_IL or V_IH,
I_OL= 24mA⁽⁴⁾
V_I = V_CC, GND
T_A = +25°C T_A = –40°C to +85°C
Typ.
Guaranteed Limits
1.5 2.0
2.0
1.5 2.0
2.0
1.5 0.8
0.8
1.5 0.8
0.8
4.49 4.4
4.4
5.49 5.4
5.4
3.86
3.76
Units
V
V
V
4.86
4.76
0.001 0.1
0.1
V
0.001 0.1
0.1
0.36
0.44
0.36
0.44
±0.1
±1.0
µA
5.5 V_I = V_CC – 2.1V
0.6
1.5
mA
5.5 V_OLD = 1.65V Max.
75
mA
5.5 V_OHD = 3.85V Min.
–75
mA
5.5 V_IN = V_CC or GND
2.0
20.0
µA
Notes:
4. All outputs loaded; thresholds on input associated with output under test.
5. Maximum test duration 2.0ms, one output loaded at a time.
©1988 Fairchild Semiconductor Corporation
74AC00, 74ACT00 Rev. 1.4.1
4
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