SPT9712 Datasheet, PDF (3/7 Pages) Fairchild Semiconductor – 12-BIT, 100 MWPS ECL D/A CONVERTER

ELECTRICAL SPECIFICATIONS
T_A = T_MIN – T_MAX, V_EE = –5.2 V, R_SET = 7.5 kΩ, Control Amp In = Ref Out, V_OUT = 0 V, unless otherwise specified.
PARAMETERS
TEST
CONDITIONS
TEST
SPT9712A
SPT9712B
LEVEL MIN TYP MAX MIN TYP MAX
Voltage Input and Control
Reference Input Impedance
Ref. Multiplying Bandwidth
Internal Reference Voltage
Internal Reference Voltage Drift
Amplifier Input Impedance
Amplifier Input Bandwidth
+25 °C
+25 °C
+25 °C
+25 °C
V
3
3
V
40
40
VI –1.15 –1.20 –1.25 –1.15 –1.20 –1.25
V
50
50
V
3
3
V
1
1
Digital Inputs
Logic 1 Voltage
Logic 0 Voltage
Logic 1 Current
Logic 0 Current
Input Capacitance
Input Setup Time – t_S
Input Setup Time – t_S
Input Hold Time – t_H
Input Hold Time – t_H
Latch Pulse Width – t_PWL, t_PWH
Full Temp.
Full Temp.
Full Temp.
Full Temp.
+25 °C
+25 °C
Full Temp.
+25 °C
Full Temp.
+25 °C
VI –1.0 –0.8
–1.0 –0.8
VI
–1.7 –1.5
–1.7 –1.5
VI
20
20
VI
10
10
V
3
3
IV
3
2
3
2
IV
3.5
3.5
IV
0.5 0
0.5 0
IV
0.5
0.5
IV
5.0 4.0
5.0 4.0
UNITS
kΩ
MHz
V
ppm/°C
MΩ
MHz
V
V
µA
µA
pF
ns
ns
ns
ns
ns
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at T_A = +25 °C, and sample tested at the
specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and characteri-
zation data.
Parameter is a typical value for information purposes only.
100% production tested at T_A = +25 °C. Parameter is guaranteed
over specified temperature range.
SPT9712
3
2/15/01