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FAN3988 Datasheet, PDF (3/9 Pages) Fairchild Semiconductor – USB/Charger and Over-Voltage Detection Device
Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
VBUS
DC Supply Voltage
Parameter
Min.
-0.3
Max.
20.0
Unit
V
Reliability Information
Symbol
TJ
TSTG
JA
Parameter
Junction Temperature
Storage Temperature Range
Thermal Resistance, JEDEC Standard,
Multi-layer Test Boards, Still Air
Min.
-65
Typ.
41
Max.
+150
+150
Unit
°C
°C
°C/W
ESD Information
Symbol
ESD
Parameter
Human Body Model, JESD22-A114
Electrostatic Discharge Information
Charged Device Model, JESD22-C101
Max.
5
2
Unit
kV
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to Absolute Maximum Ratings.
Symbol
TA
VBUS
Parameter
Operating Temperature Range
Supply Voltage Range
Min.
-40
2.7
Typ.
5.0
Max.
+85
20.0
Unit
°C
V
© 2007 Fairchild Semiconductor Corporation
FAN3988 • Rev. 1.0.10
3
www.fairchildsemi.com