74F825_00 Datasheet, PDF (3/6 Pages) Fairchild Semiconductor – 8-Bit D-Type Flip-Flop

Absolute Maximum Ratings(Note 1)
Storage Temperature
−65°C to +150°C
Ambient Temperature under Bias
−55°C to +125°C
Junction Temperature under Bias
−55°C to +150°C
V_CC Pin Potential to Ground Pin
Input Voltage (Note 2)
−0.5V to +7.0V
−0.5V to +7.0V
Input Current (Note 2)
−30 mA to +5.0 mA
Voltage Applied to Output
in HIGH State (with V_CC = 0V)
Standard Output
3-STATE Output
−0.5V to V_CC
−0.5V to +5.5V
Current Applied to Output
in LOW State (Max)
twice the rated I_OL (mA)
Recommended Operating
Conditions
Free Air Ambient Temperature
Supply Voltage
0°C to +70°C
+4.5V to +5.5V
Note 1: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
Symbol
Parameter
Min
Typ
Max
Units
V_CC
Conditions
V_IH
Input HIGH Voltage
2.0
V_IL
Input LOW Voltage
V_CD
Input Clamp Diode Voltage
V_OH
Output HIGH
10% V_CC
2.5
Voltage
10% V_CC
2.4
5% V_CC
2.7
5% V_CC
2.7
V_OL
Output LOW Voltage
10% V_CC
I_IH
Input HIGH
Current
V
Recognized as a HIGH Signal
0.8
V
Recognized as a LOW Signal
−1.2
V
Min I_IN = −18 mA
I_OH = −1 mA
V
Min
I_OH = −3 mA
I_OH = −1 mA
I_OH = −3 mA
0.5
V
Min I_OL = 24 mA
5.0
µA
Max V_IN = 2.7V
I_BVI
Input HIGH Current
Breakdown Test
7.0
µA
Max V_IN = 7.0V
I_CEX
Output HIGH
Leakage Current
50
µA
Max V_OUT = V_CC
V_ID
Input Leakage
Test
4.75
V
0.0
I_ID = 1.9 µA
All Other Pins Grounded
I_OD
Output Leakage
Circuit Current
3.75
µA
0.0
V_IOD = 150 mV
All Other Pins Grounded
I_IL
I_OZH
I_OZL
I_OS
I_ZZ
I_CCZ
Input LOW Current
Output Leakage Current
Output Leakage Current
Output Short-Circuit Current
Buss Drainage Test
Power Supply Current
−0.6
mA
Max V_IN = 0.5V
50
µA
Max V_OUT = 2.7V
−50
µA
Max V_OUT = 0.5V
−60
−150
mA
Max V_OUT = 0V
500
µA
0.0V V_OUT = 5.25V
75
90
mA
Max V_O = HIGH Z
3
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