100329A Datasheet, PDF (3/8 Pages) Fairchild Semiconductor – Low Power Octal ECL/TTL Bidirectional Translator with Register

Absolute Maximum Ratings(Note 4)
Storage Temperature (T_STG)
Maximum Junction Temperature (T_j)
V_EE Pin Potential to Ground Pin
V_TTL Pin Potential to Ground Pin
ECL Input Voltage (DC)
ECL Output Current
−65°C to +150°C
+150°C
−7.0V to +0.5V
−0.5V to +6.0V
V_EE to +0.5V
(DC Output HIGH)
−50 mA
TTL Input Voltage (Note 6)
−0.5V to +6.0V
TTL Input Current (Note 6)
−30 mA to +5.0 mA
Voltage Applied to Output
in HIGH State
3-STATE Output
−0.5V to +5.5V
Current Applied to TTL Output
in LOW State (Max)
ESD (Note 5)
twice the rated I_OL (mA)
≥2000V
Recommended Operating
Conditions
Case Temperature (T_C)
ECL Supply Voltage (V_EE)
TTL Supply Voltage (V_TTL)
0°C to +85°C
−5.7V to −4.2V
+4.5V to +5.5V
Note 4: The “Absolute Maximum Ratings” are those values beyond which
the safety of the device cannot be guaranteed. The device should not be
operated at these limits. The parametric values defined in the Electrical
Characteristics tables are not guaranteed at the absolute maximum rating.
The “Recommended Operating Conditions” table will define the conditions
for actual device operation.
Note 5: ESD testing conforms to MIL-STD-883, Method 3015.
Note 6: Either voltage limit or current limit is sufficient to protect inputs.
TTL-to-ECL DC Electrical Characteristics (Note 7)
V_EE = −4.2V to −5.7V, V_CC = V_CCA = GND, T_C = 0°C to +85°C, V_TTL = +4.5V to +5.5V
Symbol
Parameter
Min
Typ
Max
Units
Conditions
V_OH
Output HIGH Voltage
V_OL
Output LOW Voltage
Cutoff Voltage
−1025
−1830
−955
−1705
−870
−1620
mV V_IN = V_IH (Max) or V_IL (Min)
mV Loading with 50Ω to −2V
OE or DIR LOW,
−2000 −1950
mV V_IN = V_IH (Max) or V_IL (Min)
Loading with 50Ω to −2V
V_OHC
Output HIGH Voltage
Corner Point HIGH
−1035
mV V_IN = V_IH (Min) or V_IL (Max)
Loading with 50Ω to −2V
V_OLC
Output LOW Voltage
Corner Point LOW
−1610
mV
V_IH
V_IL
I_IH
I_IL
V_FCD
Input HIGH Voltage
Input LOW Voltage
Input HIGH Current
Breakdown Test
Input LOW Current
Input Clamp
Diode Voltage
2.0
0
−700
−1.2
5.0
V
Over V_TTL, V_EE, T_C Range
0.8
V
Over V_TTL, V_EE, T_C Range
70
µA
V_IN = +2.7V
1.0
mA V_IN = +5.5V
µA
V_IN = +0.5V
V
I_IN = −18 mA
I_EE
V_EE Supply Current
LE LOW, OE and DIR HIGH
Inputs OPEN
−189
−94
mA V_EE = −4.2V to −4.8V
−199
−94
V_EE = −4.2V to −5.7V
Note 7: The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional
noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho-
sen to guarantee operation under “worst case” conditions.
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