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SFU9120TU Datasheet, PDF (2/7 Pages) Fairchild Semiconductor – Avalanche Rugged Technology
SFR/U9120
P-CHANNEL
POWER MOSFET
Electrical Characteristics (TC=25oC unless otherwise specified)
Symbol
BVDSS
∆BV/∆TJ
VGS(th)
IGSS
IDSS
RDS(on)
gfs
Ciss
Coss
Crss
td(on)
tr
td(off)
tf
Qg
Qgs
Qgd
Characteristic
Min. Typ. Max. Units
Test Condition
Drain-Source Breakdown Voltage
Breakdown Voltage Temp. Coeff.
Gate Threshold Voltage
Gate-Source Leakage , Forward
Gate-Source Leakage , Reverse
Drain-to-Source Leakage Current
Static Drain-Source
On-State Resistance
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Total Gate Charge
Gate-Source Charge
Gate-Drain(“Miller”) Charge
-100 --
-- -0.1
-2.0 --
-- --
-- --
-- --
-- --
-- --
-- 3.4
-- 425
-- 90
-- 31
-- 11
-- 21
-- 34
-- 18
-- 16
-- 3.1
-- 6.3
-- V
-- V/oC
-4.0 V
-100 nA
100
-10
-100 µA
0.6 Ω
-- S
550
135 pF
45
30
50
ns
80
45
20
-- nC
--
VGS=0V,ID=-250µA
ID=-250µA See Fig 7
VDS=-5V,ID=-250µA
VGS=-20V
VGS=20V
VDS=-100V
VDS=-80V,TC=125oC
VGS=-10V,ID=-2.5A O4
VDS=-40V,ID=-2.5A O4
VGS=0V,VDS=-25V,f =1MHz
See Fig 5
VDD=-50V,ID=-6A,
RG=18 Ω
See Fig 13
O4 O5
VDS=-80V,VGS=-10V,
ID=-6A
See Fig 6 & Fig 12 O4 O5
Source-Drain Diode Ratings and Characteristics
Symbol
IS
ISM
VSD
trr
Qrr
Characteristic
Continuous Source Current
Pulsed-Source Current
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
Min. Typ. Max. Units
Test Condition
--
O1 --
-- -4.9
Integral reverse pn-diode
A
-- -20
in the MOSFET
O4 -- -- -3.8 V TJ=25oC,IS=-4.9A,VGS=0V
-- 105 -- ns TJ=25oC,IF=-6A
-- 0.4 -- µC diF/dt=100A/µs
O4
Notes ;
O1 Repetitive Rating : Pulse Width Limited by Maximum Junction Temperature
O2 L=9.0mH, IAS=-4.9A, VDD=-25V, RG=27Ω*, Starting TJ =25oC
O3 ISD <_ -6A, di/dt <_ 350A/µs, VDD <_ BVDSS , Starting TJ =25oC
O4 Pulse Test : Pulse Width = 250µs, Duty Cycle<_ 2%
O5 Essentially Independent of Operating Temperature