QRD1113 Datasheet, PDF (2/4 Pages) QT Optoelectronics – REFLECTIVE OBJECT SENSOR

Absolute Maximum Ratings (T_A = 25°C unless otherwise specified)
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
T_OPR
T_STG
T_SOL-I
T_SOL-F
EMITTER
I_F
V_R
P_D
SENSOR
V_CEO
V_ECO
P_D
Parameter
Operating Temperature
Storage Temperature
Lead Temperature (Solder Iron)^(2,3)
Lead Temperature (Solder Flow)^(2,3)
Continuous Forward Current
Reverse Voltage
Power Dissipation⁽¹⁾
Collector-Emitter Voltage
Emitter-Collector Voltage
Power Dissipation⁽¹⁾
Rating
-40 to +85
-40 to +100
240 for 5 sec
260 for 10 sec
50
5
100
30
100
Units
°C
°C
°C
°C
mA
V
mW
V
V
mW
Electrical/Optical Characteristics (T_A = 25°C)
Symbol Parameter
Test Conditions
INPUT (Emitter)
V_F Forward Voltage
I_R
Reverse Leakage Current
λ_PE Peak Emission Wavelength
OUTPUT (Sensor)
I_F = 20mA
V_R = 5V
I_F = 20mA
BV_CEO Collector-Emitter Breakdown
BV_ECO Emitter-Collector Breakdown
I_D
Dark Current
COUPLED
I_C(ON)
I_C(ON)
V_CE(SAT)
QRD1113 Collector Current
QRD1114 Collector Current
Collector Emitter Saturation
Voltage
I_CX Cross Talk
t_r
Rise Time
t_f
Fall Time
I_C = 1mA
I_E = 0.1mA
V_CE = 10 V, I_F = 0mA
I_F = 20mA, V_CE = 5V, D = .050"^(6,8)
I_F = 20mA, V_CE = 5V, D = .050"^(6,8)
I_F = 40mA, I_C = 100µA, D = .050"^(6,8)
I_F = 20mA, V_CE = 5V, E_E = 0⁽⁷⁾
V_CE = 5V, R_L = 100Ω, I_C(ON) = 5mA
Min.
30
5
0.300
1
Typ.
940
.200
10
50
Max. Units
1.7
V
100 µA
nm
V
V
100 nA
mA
mA
0.4
V
10
µA
µs
µs
Notes:
1. Derate power dissipation linearly 1.33mW/°C above 25°C.
2. RMA flux is recommended.
3. Methanol or isopropyl alcohols are recommended as cleaning agents.
4. Soldering iron tip 1/16” (1.6 mm) minimum from housing.
5. As long as leads are not under any stress or spring tension.
6. D is the distance from the sensor face to the reflective surface.
7. Crosstalk (I_CK) is the collector current measured with the indicated current on the input diode and with no reflective surface.
8. Measured using Eastman Kodak neutral white test card with 90% diffused reflecting as a reflecting surface.
©2005 Fairchild Semiconductor Corporation
QRD1113, QRD1114 Rev. 1.1.0
2
www.fairchildsemi.com