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IRF630A Datasheet, PDF (2/7 Pages) Fairchild Semiconductor – Advanced Power MOSFET
IRF630A
N-CHANNEL
POWER MOSFET
Electrical Characteristics (TC=25oC unless otherwise specified)
Symbol
BVDSS
∆BV/∆TJ
VGS(th)
IGSS
IDSS
RDS(on)
gfs
Ciss
Coss
Crss
td(on)
tr
td(off)
tf
Qg
Qgs
Qgd
Characteristic
Min. Typ. Max. Units
Test Condition
Drain-Source Breakdown Voltage
Breakdown Voltage Temp. Coeff.
Gate Threshold Voltage
Gate-Source Leakage , Forward
Gate-Source Leakage , Reverse
Drain-to-Source Leakage Current
200 -- -- V VGS=0V,ID=250 µA
-- 0.21 -- V/ oC ID=250 µA See Fig 7
2.0 -- 4.0 V VDS=5V,ID=250 µA
-- -- 100 nA VGS=30V
-- -- -100
VGS=-30V
-- -- 10
VDS=200V
-- -- 100 µA VDS=160V,TC=125 oC
Static Drain-Source
On-State Resistance
-- -- 0.4 Ω VGS=10V,ID=4.5A
O4
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
-- 3.87 -- Ω VDS=40V,ID=4.5A
O4
-- 500 650
-- 95 110 pF VGS=0V,VDS=25V,f =1MHz
See Fig 5
-- 45 55
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
-- 13 40
-- 13 40
VDD=100V,ID=9A,
-- 30 70 ns RG=12 Ω
See Fig 13
-- 18 50
O4 O5
Total Gate Charge
Gate-Source Charge
Gate-Drain( “Miller” ) Charge
-- 22 29
-- 4.3 --
-- 10.9 --
VDS=160V,VGS=10V,
nC
ID=9A
See Fig 6 & Fig 12
O4 O5
Source-Drain Diode Ratings and Characteristics
Symbol
IS
ISM
VSD
trr
Qrr
Characteristic
Continuous Source Current
Pulsed-Source Current
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
Min. Typ. Max. Units
Test Condition
--
O1 --
O4 --
--
--
-- 9
-- 36
-- 1.5
137 --
0.68 --
Integral reverse pn-diode
A
in the MOSFET
V TJ=25oC ,IS=9A,VGS=0V
ns TJ=25 oC ,IF=9A
µC diF/dt=100A/ µs
O4
Notes ;
O1 Repetitive Rating : Pulse Width Limited by Maximum Junction Temperature
O2 L=3mH, IAS=9A, VDD=50V, RG=27Ω, Starting TJ =25 oC
O3 ISD <_ 9A, di/dt <_ 220A/µs, VDD <_ BVDSS , Starting TJ =25 oC
O4 Pulse Test : Pulse Width = 250 µs, Duty Cycle <_ 2%
O5 Essentially Independent of Operating Temperature