English
Language : 

FQP16N25C Datasheet, PDF (2/10 Pages) Fairchild Semiconductor – 250V N-Channel MOSFET
Electrical Characteristics
Symbol
Parameter
TC = 25°C unless otherwise noted
Test Conditions
Min Typ Max Units
Off Characteristics
BVDSS
∆BVDSS
/ ∆TJ
Drain-Source Breakdown Voltage
Breakdown Voltage Temperature
Coefficient
VGS = 0 V, ID = 250 µA
250 --
ID = 250 µA, Referenced to 25°C -- 0.31
IDSS
Zero Gate Voltage Drain Current
VDS = 250 V, VGS = 0 V
VDS = 200 V, TC = 125°C
--
--
--
--
IGSSF
Gate-Body Leakage Current, Forward VGS = 30 V, VDS = 0 V
--
--
IGSSR
Gate-Body Leakage Current, Reverse VGS = -30 V, VDS = 0 V
--
--
--
--
10
100
100
-100
V
V/°C
µA
µA
nA
nA
On Characteristics
VGS(th) Gate Threshold Voltage
RDS(on) Static Drain-Source
On-Resistance
gFS
Forward Transconductance
VDS = VGS, ID = 250 µA
2.0 --
4.0
V
VGS = 10 V, ID = 7.8 A
-- 0.22 0.27
Ω
VDS = 40 V, ID = 7.8 A
(Note 4) -- 10.5
--
S
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
VDS = 25 V, VGS = 0 V,
f = 1.0 MHz
-- 830 1080 pF
-- 170 220
pF
-- 68
89
pF
Switching Characteristics
td(on)
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
tf
Turn-Off Fall Time
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
VDD = 125 V, ID = 15.6 A,
RG = 25 Ω
--
15
40
ns
-- 130 270
ns
-- 135 280
ns
(Note 4, 5)
--
105
220
ns
VDS = 200 V, ID = 15.6 A,
-- 41 53.5 nC
VGS = 10 V
-- 5.6
--
nC
(Note 4, 5) --
22.7
--
nC
Drain-Source Diode Characteristics and Maximum Ratings
IS
Maximum Continuous Drain-Source Diode Forward Current
--
-- 15.6
A
ISM
Maximum Pulsed Drain-Source Diode Forward Current
--
-- 62.4
A
VSD
Drain-Source Diode Forward Voltage VGS = 0 V, IS = 15.6 A
--
--
1.5
V
trr
Reverse Recovery Time
Qrr
Reverse Recovery Charge
VGS = 0 V, IS = 15.6 A,
-- 260
--
ns
dIF / dt = 100 A/µs
(Note 4) --
2.47
--
µC
Notes:
1. Repetitive Rating : Pulse width limited by maximum junction temperature
2. L = 2.7mH, IAS = 15.6A, VDD = 50V, RG = 25 Ω, Starting TJ = 25°C
3. ISD ≤ 15.6A, di/dt ≤ 300A/µs, VDD ≤ BVDSS, Starting TJ = 25°C
4. Pulse Test : Pulse width ≤ 300µs, Duty cycle ≤ 2%
5. Essentially independent of operating temperature
©2004 Fairchild Semiconductor Corporation
Rev. A, March 2004