FOD3150 Datasheet, PDF (14/19 Pages) Fairchild Semiconductor – High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler

Test Circuit (Continued)
1
2
+
–
F = 10kHz
Probe
3
DC = 50%
50Ω
4
8
0.1µF
7
V_O
+
–
V_CC = 15 to 30V
6
Rg = 20Ω
Cg = 10nF
5
I_F
t_r
V_OUT
t_f
90%
50%
10%
t_PLH
t_PHL
Figure 29. t_PHL, t_PLH, t_R and t_F Test Circuit and Waveforms
I_F
A
B
5V
+
–
V_CM
1
8
2
7
3
6
4
5
+–
V_CM = 2,000V
0.1µF
V_O
+
–
V_CC = 30V
0V
∆t
V_O
Switch at A: I_F = 10mA
V_O
Switch at B: I_F = 0mA
V_OH
V_OL
Figure 30. CMR Test Circuit and Waveforms
©2008 Fairchild Semiconductor Corporation
FOD3150 Rev. 1.0.4
14
www.fairchildsemi.com