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FSTUD32450 Datasheet, PDF (11/13 Pages) Fairchild Semiconductor – Configurable 4-Bit to 40-Bit Bus Switch with -2V Undershoot Protection and Selectable Level Shifting
Undershoot Characteristic (Note 12)
Symbol
Parameter
Min
Typ
Max
Units
Conditions
VOUTU
Output Voltage During Undershoot
2.5
VOH − 0.3
V
S2 = S5 = 0V, Figure 1
TBD
TBD
V
S2 = S5 = VCC
Note 12: This test is intended to characterize the device’s protective capabilities by maintaining output signal integrity during an input transient voltage
undershoot event.
FIGURE 1.
Device Test Conditions
Parameter
VIN
R1 = R2
VTRI
VCC
Value
see Waveform
100K
11.0
5.5
Units
V
Ω
V
V
AC Loading and Waveforms
Transient
Input Voltage (VIN) Waveform
Note: Input driven by 50Ω source terminated in 50Ω
Note: CL includes load and stray capacitance
Note: Input Frequency = 1.0 MHz, tW = 500 ns
FIGURE 2. AC Test Circuit
FIGURE 3. AC Waveforms
11
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