SCAN18245T Datasheet, PDF (1/11 Pages) National Semiconductor (TI) – Non-Inverting Transceiver with TRI-STATE Outputs

October 1991
Revised May 2000
SCAN18245T
Non-Inverting Transceiver with 3-STATE Outputs
General Description
The SCAN18245T is a high speed, low-power bidirectional
line driver featuring separate data inputs organized into
dual 9-bit bytes with byte-oriented output enable and direc-
tion control signals. This device is compliant with IEEE
1149.1 Standard Test Access Port and Boundary Scan
Architecture with the incorporation of the defined boundary-
scan test logic and test access port consisting of Test Data
Input (TDI), Test Data Out (TDO), Test Mode Select (TMS),
and Test Clock (TCK).
Features
s IEEE 1149.1 (JTAG) Compliant
s Dual output enable control signals
s 3-STATE outputs for bus-oriented applications
s 9-bit data busses for parity applications
s Reduced-swing outputs source 32 mA/sink 64 mA
s Guaranteed to drive 50Ω transmission line to TTL input
levels of 0.8V and 2.0V
s TTL compatible inputs
s 25 mil pitch SSOP (Shrink Small Outline Package)
s Includes CLAMP and HIGHZ instructions
s Member of Fairchild’s SCAN Products
Ordering Code:
Order Number Package Number
Package Description
SCAN18245TSSC
MS56A
56-Lead Shrink Small Outline Package (SSOP), JEDEC MO-118, 0.300 Wide
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Connection Diagram
Pin Descriptions
Pin Names
Description
A1_(0–8)
B1_(0–8)
A2_(0–8)
B2_(0–8)
G1, G2
Side A1 Inputs or 3-STATE Outputs
Side B1 Inputs or 3-STATE Outputs
Side A2 Inputs or 3-STATE Outputs
Side B2 Inputs or 3-STATE Outputs
Output Enable Pins
DIR1, DIR2 Direction of Data Flow Pins
© 2000 Fairchild Semiconductor Corporation DS010961
www.fairchildsemi.com