SCAN182374A Datasheet, PDF (1/12 Pages) Fairchild Semiconductor – D-Type Flip-Flop with 25Ω Series Resistor Outputs

January 1993
Revised August 2000
SCAN182374A
D-Type Flip-Flop with 25Ω Series Resistor Outputs
General Description
The SCAN182374A is a high performance BiCMOS D-type
flip-flop featuring separate D-type inputs organized into
dual 9-bit bytes with byte-oriented clock and output enable
control signals. This device is compliant with IEEE 1149.1
Standard Test Access Port and Boundary Scan Architec-
ture with the incorporation of the defined boundary-scan
test logic and test access port consisting of Test Data Input
(TDI), Test Data Out (TDO), Test Mode Select (TMS), and
Test Clock (TCK).
Features
s IEEE 1149.1 (JTAG) Compliant
s High performance BiCMOS technology
s 25Ω series resistor outputs eliminate need for external
terminating resistors
s Buffered positive edge-triggered clock
s 3-STATE outputs for bus-oriented applications
s 25 mil pitch SSOP (Shrink Small Outline Package)
s Includes CLAMP, IDCODE and HIGHZ instructions
s Additional instructions SAMPLE-IN, SAMPLE-OUT and
EXTEST-OUT
s Power up 3-STATE for hot insert
s Member of Fairchild’s SCAN Products
Ordering Code:
Order Number Package Number
Package Description
SCAN182374ASSC
MS56A
56-Lead Shrink Small Outline Package (SSOP), JEDEC MO-118, 0.300 Wide
Device also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Connection Diagram
Pin Descriptions
Pin Names
AI_(0–8), BI_(0–8)
ACP, BCP
AOE₁, BOE₁
AO_(0–8), BO_(0–8)
Description
Data Inputs
Clock Pulse Inputs
3-STATE Output Enable Inputs
3-STATE Outputs
Truth Tables
ACP
^X
Inputs
AOE₁
(Note 1)
H
L
L
AI_(0–8)
X
L
H
AO_(0–8)
Z
L
H
Inputs
BCP
BOE₁
(Note 1)
BI_(0–8)
BO_(0–8)
^X
H
L
L
X
L
H
Z
L
H
H = HIGH Voltage Level
L = LOW Voltage Level
X = Immaterial
Z = High Impedance
= L-to-H Transition
Note 1: Inactive-to-active transition must occur to enable outputs upon
power-up.
© 2000 Fairchild Semiconductor Corporation DS011545
www.fairchildsemi.com