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NZT749 Datasheet, PDF (1/3 Pages) Fairchild Semiconductor – PNP Current Driver Transistor
NZT749
PNP Current Driver Transistor
• This device is designed for power amplifier, regulator and switching
circuit where speed is important.
• Sourced from process 5P.
4
3
2
1
SOT-223
Absolute Maximum Ratings* Ta=25°C unless otherwise noted
Symbol
Parameter
VCEO
Collector-Emitter Voltage
VCBO
Collector-Base Voltage
VEBO
Emitter-Base Voltage
IC
Collector Current (DC)
- Continuous
TJ, TSTG
Operating and Storage Junction Temperature Range
* These ratings are limiting values above which the serviceability of any semiconductor device may be impaired.
1. Base 2, 4. Collector 3. Emitter
Value
-25
-35
-5.0
-4.0
- 55 ~ 150
Units
V
V
V
A
°C
NOTES:
1) These ratings are based on a maximum junction temperature of 150 degrees C.
2) These are steady state limits. The factory should be consulted on applications involving pulsed or low duty cycle operations
Electrical Characteristics Ta=25°C unless otherwise noted
Symbol
Parameter
Test Condition
Off Characteristics
V(BR)CEO
Collector-Emitter Voltage
V(BR)CBO
Collector-Base Voltage
V(BR)EBO
Emitter-Base Voltage
ICBO
Collector Cut-off Current
IEBO
Emitter Cut-off Current
On Characteristics *
IC = -10mA, IB = 0
IC = -100µA, IE = 0
IE = -10µA, IC = 0
VCB = -30V, IE = 0
VEB = -4V, IC = 0
hFE
DC Current Gain
VCE(sat)
Collector-Emitter Saturation Voltage
VBE(sat)
Base-Emitter Saturation Voltage
VBE(on)
Base-Emitter On Voltage
Small Signal Characteristics
VCE = -2.0V, IC = -50mA
VCE = -2.0V, IC = -1.0A
VCE = -2.0V, IC = -2.0A
IC = -1.0A, IB = -100mA
IC = -1.0A, IB = -100mA
IC = -1.0A, VCE = -2.0V
fT
Current gain Bandwidth Product
* Pulse Test: Pulse Width ≤ 300µs, Duty Cycle ≤ 2.0%
VCE = -5.0V, IC = -50mA
f = 100MHz
Min. Max. Units
-25
V
-35
V
-5.0
V
-100
nA
-0.1
µA
70
80
300
65
-0.3
V
-1.25
V
-1.0
V
75
MHz
Thermal Characteristics Ta=25°C unless otherwise noted
Symbol
Parameter
Max.
PD
Total Device Dissipation
1.2
Derate above 25°C
9.7
RθJA
Thermal Resistance, Junction to Ambient
103
Units
W
mW/°C
°C/W
©2004 Fairchild Semiconductor Corporation
Rev. A, July 2004