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NDC632P Datasheet, PDF (1/10 Pages) Fairchild Semiconductor – P-Channel Logic Level Enhancement Mode Field Effect Transistor
June1996
NDC632P
P-Channel Logic Level Enhancement Mode Field Effect Transistor
General Description
These P-Channel logic level enhancement mode
power field effect transistors are produced using
Fairchild's proprietary, high cell density, DMOS
technology. This very high density process is
especially tailored to minimize on-state resistance.
These devices are particularly suited for low voltage
applications such as notebook computer power
management and other battery powered circuits
where fast high-side switching, and low in-line power
loss are needed in a very small outline surface
mount package.
Features
-2.7A, -20V. RDS(ON) = 0.14Ω @ VGS = -4.5V
RDS(ON) = 0.2Ω @ VGS = -2.7V.
Proprietary SuperSOTTM-6 package design using copper
lead frame for superior thermal and electrical capabilities.
High density cell design for extremely low RDS(ON).
Exceptional on-resistance and maximum DC current
capability.
___________________________________________________________________________________________
SuperSOTTM-6
4
3
5
2
6
1
Absolute Maximum Ratings
Symbol Parameter
TA = 25°C unless otherwise noted
VDSS
Drain-Source Voltage
VGSS
Gate-Source Voltage - Continuous
ID
Drain Current - Continuous
- Pulsed
PD
Maximum Power Dissipation
(Note 1a)
(Note 1b)
(Note 1c)
TJ,TSTG Operating and Storage Temperature Range
THERMAL CHARACTERISTICS
RθJA
RθJC
Thermal Resistance, Junction-to-Ambient
Thermal Resistance, Junction-to-Case
(Note 1a)
(Note 1)
© 1997 Fairchild Semiconductor Corporation
NDC632P
-20
-8
-2.7
-10
1.6
1
0.8
-55 to 150
78
30
Units
V
V
A
W
°C
°C/W
°C/W
NDC632P Rev. B1