HUFA75433S3S Datasheet, PDF (1/11 Pages) Fairchild Semiconductor – N-Channel UltraFET MOSFETs 60V, 64A, 16mΩ

March 2002
HUFA75433S3S
N-Channel UltraFET^® MOSFETs
60V, 64A, 16mΩ
General Description
These N-Channel power MOSFETs are manufactured us-
ing the innovative UltraFET^® process. This advanced pro-
cess technology achieves very low on-resistance per
silicon area, resulting in outstanding performance. This de-
vice is capable of withstanding high energy in the ava-
lanche mode and the diode exhibits very low reverse
recovery time and stored charge. It was designed for use in
applications where power efficiency is important, such as
switching regulators, switching convertors, motor drivers,
relay drivers, low-voltage bus switches, and power man-
agement in portable and battery-operated products.
Applications
• Motor and Load Control
• Powertrain Management
Features
• 175°C Maximum Junction Temperature
• UIS Capability (Single Pulse and Repetitive Pulse)
• Ultra-Low On-Resistance r_DS(ON) = 0.016Ω, V_GS = 10V
D
D
G
S
TO-263AB
FDB Series
G
S
MOSFET Maximum Ratings T_C = 25°C unless otherwise noted
Symbol
V_DSS
V_GS
I_D
E_AS
P_D
Parameter
Drain to Source Voltage
Gate to Source Voltage
Drain Current
Continuous (T_C = 25^oC, V_GS = 10V)
Continuous (T_C = 125^oC, V_GS = 10V, R_θJA = 43^oC/W)
Pulsed
Single Pulse Avalanche Energy (Note 1)
Power dissipation
Derate above 25^oC
T_J, T_STG Operating and Storage Temperature
Ratings
60
±20
64
5
Figure 4
250
150
1
-55 to 175
Units
V
V
A
A
A
mJ
W
W/^oC
o_C
Thermal Characteristics
R_θJC
Thermal Resistance Junction to Case TO-263
1
R_θJA
Thermal Resistance Junction to Ambient TO-263
62
R_θJA
Thermal Resistance Junction to Ambient TO-263, 1in² copper pad area
43
o_C/W
o_C/W
o_C/W
This product has been designed to meet the extreme test conditions and environment demanded by the automotive industry. For a
copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/
Reliability data can be found at: http://www.fairchildsemi.com/products/discrete/reliability/index.html.
All Fairchild Semiconductor products are manufactured, assembled and tested under ISO9000 and QS9000 quality systems
certification.
©2002 Fairchild Semiconductor Corporation
Rev. A