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FQD7N20LTM Datasheet, PDF (1/8 Pages) Fairchild Semiconductor – N-Channel QFET® MOSFET
FQD7N20L
N-Channel QFET® MOSFET
200 V, 5.5 A, 750 mΩ
November 2013
Description
This N-Channel enhancement mode power MOSFET is
produced using Fairchild Semiconductor’s proprietary planar
stripe and DMOS technology. This advanced MOSFET
technology has been especially tailored to reduce on-state
resistance, and to provide superior switching performance
and high avalanche energy strength. These devices are
suitable for switched mode power supplies, active power
factor correction (PFC), and electronic lamp ballasts.
Features
• 5.5 A, 200 V, RDS(on) = 750 mΩ (Max.) @ VGS = 10 V,
ID = 2.75 A
• Low Gate Charge (Typ. 6.8 nC)
• Low Crss (Typ. 8.5 pF)
• 100% Avalanche Tested
• RoHS Compliant
• Low Level Gate Drive Requirement Allowing Direct
Operating from Logic Drivers
D
D
G
S
D-PAK
G
Absolute Maximum Ratings TC = 25°C unless otherwise noted.
Symbol
VDSS
ID
IDM
VGSS
EAS
IAR
EAR
dv/dt
PD
TJ, TSTG
TL
Parameter
Drain-Source Voltage
Drain Current
Drain Current
- Continuous (TC = 25°C)
- Continuous (TC = 100°C)
- Pulsed
Gate-Source Voltage
Single Pulsed Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
Power Dissipation (TA = 25°C) *
Power Dissipation (TC = 25°C)
- Derate above 25°C
Operating and Storage Temperature Range
Maximum lead temperature for soldering,
1/8” from case for 5 seconds
(Note 1)
(Note 2)
(Note 1)
(Note 1)
(Note 3)
S
FQD7N20LTM
200
5.5
3.48
22
± 20
73
5.5
4.5
5.5
2.5
45
0.36
-55 to +150
300
Unit
V
A
A
A
V
mJ
A
mJ
V/ns
W
W
W/°C
°C
°C
Thermal Characteristics
Symbol
Parameter
RJC
RJA
Thermal Resistance, Junction to Case, Max.
Thermal Resistance, Junction to Ambient (Minimum Pad of 2-oz Copper), Max.
Thermal Resistance, Junction to Ambient (*1 in2 Pad of 2-oz Copper), Max.
FQD7N20LTM
2.78
110
50
Unit
oC/W
©2004 Fairchild Semiconductor Corporation
1
FQD7N20L Rev. C1
www.fairchildsemi.com