English
Language : 

FQD20N06LTM Datasheet, PDF (1/8 Pages) Fairchild Semiconductor – N-Channel QFET® MOSFET 60 V, 17.2 A, 42 mΩ
FQU20N06L
N-Channel QFET® MOSFET
60 V, 17.2 A, 42 mΩ
December 2013
Description
This N-Channel enhancement mode power MOSFET is
produced using Fairchild Semiconductor’s proprietary planar
stripe and DMOS technology. This advanced MOSFET
technology has been especially tailored to reduce on-state
resistance, and to provide superior switching performance
and high avalanche energy strength. These devices are
suitable for switched mode power supplies, audio amplifier,
DC motor control, and variable switching power applications.
Features
• 17.2 A, 60 V, RDS(on) = 42 mΩ (Max.) @ VGS = 10 V,
ID = 8.6 A
• Low Gate Charge (Typ. 9.5 nC)
• Low Crss (Typ. 35 pF)
• 100% Avalanche Tested
• Low Level Gate Drive Requirements Allowing Direct
Operation Form Logic Drivers
D
GDS
I-PAK
G
S
Absolute Maximum Ratings TC = 25°C unless otherwise noted.
Symbol
VDSS
ID
IDM
VGSS
EAS
IAR
EAR
dv/dt
PD
TJ, TSTG
TL
Parameter
Drain-Source Voltage
Drain Current
Drain Current
- Continuous (TC = 25°C)
- Continuous (TC = 100°C)
- Pulsed
Gate-Source Voltage
Single Pulsed Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
Power Dissipation (TA = 25°C) *
Power Dissipation (TC = 25°C)
- Derate above 25°C
Operating and Storage Temperature Range
Maximum lead temperature for soldering,
1/8" from case for 5 seconds.
(Note 1)
(Note 2)
(Note 1)
(Note 1)
(Note 3)
FQU20N06LTU
60
17.2
10.9
68.8
± 20
170
17.2
3.8
7.0
2.5
38
0.30
-55 to +150
300
Unit
V
A
A
A
V
mJ
A
mJ
V/ns
W
W
W/°C
°C
°C
Thermal Characteristics
Symbol
Parameter
RJC
RJA
Thermal Resistance, Junction to Case, Max.
Thermal Resistance, Junction to Ambient (Minimum Pad of 2-oz Copper), Max.
Thermal Resistance, Junction to Ambient (*1 in2 Pad of 2-oz Copper), Max.
FQU20N06LTU
3.28
110
50
Unit
oC/W
©2009 Fairchild Semiconductor Corporation
1
FQU20N06L Rev. C3
www.fairchildsemi.com