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FQB8P10TM Datasheet, PDF (1/8 Pages) Fairchild Semiconductor – P-Channel QFET® MOSFET -100 V, -8.0 A, 185 mΩ
FQB8P10
P-Channel QFET® MOSFET
-100 V, -8.0 A, 185 mΩ
November 2013
Description
This P-Channel enhancement mode power MOSFET is
produced using Fairchild Semiconductor’s proprietary planar
stripe and DMOS technology. This advanced MOSFET
technology has been especially tailored to reduce on-state
resistance, and to provide superior switching performance
and high avalanche energy strength. These devices are
suitable for switched mode power supplies, audio amplifier,
DC motor control, and variable switching power applications.
Features
• -8.0 A, -100 V, RDS(on) = 185 mΩ (Max.) @ VGS = -10 V,
ID = -4.0 A
• Low Gate Charge (Typ. 12 nC)
• Low Crss (Typ. 30 pF)
• 100% Avalanche Tested
• 175°C Maximum Junction Temperature Rating
S
D
G
G
S
D2-PAK
D
Absolute Maximum Ratings TC = 25°C unless otherwise noted.
Symbol
Parameter
VDSS
Drain-Source Voltage
ID
Drain Current - Continuous (TC = 25°C)
- Continuous (TC = 100°C)
IDM
Drain Current - Pulsed
(Note 1)
VGSS
Gate-Source Voltage
EAS
Single Pulsed Avalanche Energy
(Note 2)
IAR
Avalanche Current
(Note 1)
EAR
Repetitive Avalanche Energy
(Note 1)
dv/dt
Peak Diode Recovery dv/dt
(Note 3)
PD
Power Dissipation (TA = 25°C) *
Power Dissipation (TC = 25°C)
- Derate above 25°C
TJ, TSTG
Operating and Storage Temperature Range
TL
Maximum lead temperature for soldering,
1/8" from case for 5 seconds.
FQB8P10TM
-100
-8.0
-5.7
-32
± 30
150
-8.0
6.5
-6.0
3.75
65
0.43
-55 to +175
300
Unit
V
A
A
A
V
mJ
A
mJ
V/ns
W
W
W/°C
°C
°C
Thermal Characteristics
Symbol
Parameter
RJC
RJA
Thermal Resistance, Junction to Case, Max.
Thermal Resistance, Junction to Ambient (Minimum Pad of 2-oz Copper), Max.
Thermal Resistance, Junction to Ambient (*1 in2 Pad of 2-oz Copper), Max.
FQB8P10TM
2.31
62.5
40
Unit
oC/W
©2000 Fairchild Semiconductor Corporation
1
FQB8P10 Rev. C1
www.fairchildsemi.com