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PD438BL1 Datasheet, PDF (6/7 Pages) Everlight Electronics Co., Ltd – 4.8mm Semi-Lens Silicon PIN Photodiode
PD438B/L1
Reliability Test Item And Condition
The reliability of products shall be satisfied with items listed below.
Confidence level:90%
LTPD:10%
NO. Item
Test Conditions
Test Hours/ Sample
Cycles
Sizes
1
Solder heat TEMP.:260℃±5℃
10secs
2 Temperature Cycle H : +100℃ 15mins 300Cycles
L : -40℃
5mins
15mins
3 Thermal Shock H :+100℃ 5mins 300Cycles
L :-10℃
10secs
5mins
4 High Temperature TEMP.:+100℃
1000hrs
Storage
5 Low Temperature TEMP.:-40℃
1000hrs
Storage
6 DC Operating Life VR=5V
7 High Temperature/ 85℃ / 85% R.H
1000hrs
1000hrs
High Humidity
22pcs
22pcs
22pcs
22pcs
22pcs
22pcs
22pcs
Failure
Judgement
Criteria
Ac/R
e
0/1
0/1
IL≦L×0.8
0/1
L:Lower
Specification 0/1
Limit
0/1
0/1
0/1
Everlight Electronics Co., Ltd.
Device No:DPD-043-005
http://www.everlight.com
Prepared date:07-20-2005
Rev 4
Page: 6of 7
Prepared by:Jaine Tsai