ELSF-406SYGWA Datasheet, PDF (6/8 Pages) Everlight Electronics Co., Ltd – 0.39 Quadruple Digit SMD Displays

ELSF-406SYGWA/S530-E2
■ Reliability test items and conditions:
The reliability of products shall be satisfied with items listed below.
Confidence level：90%
LTPD：10%
Failure
NO
Item
Test
Test
Sample Size Judgment Ac/Re
Conditions
Hours/Cycle
Criteria
1
Reflow
TEMP:260°C±5°C
Soldering
Min. 5 SEC
H：+100°C 15min
6 Min
2 Temperature
Cycle
∫ 5min _{300 Cycles}
L：-40°C 15min
H：+100°C 5min
3 Thermal
Shock
∫ 10 sec _{300 Cycles}
L：-10°C 5min
High
4 Temperature
TEMP:100°C
1000 HRS
Storage
Low
5 Temperature
TEMP:-40°C
1000 HRS
Storage
22 PCS
0/1
22 PCS
0/1
22 PCS
0/1
Iv≦Ivt*0.5
or
22 PCS
VF≧U
0/1
or
VF≦L
22 PCS
0/1
6 DC Operating
TEMP:25°C
1000 HRS
22 PCS
0/1
Life
If＝10mA
High
7 Temperature / ^{85°C / 85% RH}
1000 HRS
22 PCS
0/1
High
Humidity
Note：Ivt：The test Iv value of the chip before the reliability test
Iv：The test value of the chip that has completed the reliability test
U：Upper Specification Limit
L： Lower Specification Limit
Everlight Electronics Co., Ltd.
Device No.: CDGF-406-006
http://www.everlight.com
Prepared date: 2006/7/18
Rev. 1
Page: 6 of 8
Prepared by: Li Jing jing