5962-88565 Datasheet, PDF (9/13 Pages) List of Unclassifed Manufacturers – MICROCIRCUIT, LINEAR, RADIATION HARDENED, LOW NOISE, QUAD OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON

TABLE IIA. Electrical test requirements.
Test requirements
Interim electrical
parameters (see 4.2)
Final electrical
parameters (see 4.2)
Group A test
requirements (see 4.4)
Group C end-point electrical
parameters (see 4.4)
Group D end-point electrical
parameters (see 4.4)
Group E end-point electrical
parameters (see 4.4)
Subgroups
(in accordance with
MIL-STD-883,
method 5005, table I)
Device
class M
1
Subgroups
(in accordance with
MIL-PRF-38535, table III)
Device
class Q
1
Device
class V
1
1,2,3,4,5,6 1/
1,2,3,4,5,6,7
1,2,3,4,5,6 1/
1,2,3,4,5,6,7
1,2,3,4, 1/ 2/
5,6
1,2,3,4,5,6,7
1
1
1 2/
1
1
1
----
----
1, 4
1/ PDA applies to subgroup 1.
2/ See table IIB for delta measurement parameters.
Table IIB. 240 hour burn-in and group C end-point electrical parameters.
Parameter Device type
VOS
01
02
IOS
01
02
IB
01
02
Limit
Min
Max
0.4 mV
0.8 mV
10 nA
10 nA
±25 nA
±25 nA
Delta
Min
Max
100 µV
250 µV
5 nA
5 nA
5 nA
5 nA
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified. Quality conformance inspection for device
class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for
device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections
(see 4.4.1 through 4.4.4).
4.4.1 Group A inspection.
a. Tests shall be as specified in table IIA herein.
b. Subgroups 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
F
5962-88565
SHEET
9