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| AD847JRZ Datasheet, PDF (8/12 Pages) List of Unclassifed Manufacturers – MICROCIRCUIT, LINEAR, HIGH SPEED, LOW POWER, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON | |||
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TABLE I. Electrical performance characteristics â Continued.
Test
Rise time 4/ 8/
Fall time 4/ 8/
Settling time 4/
Overshoot 4/
Symbol
Conditions 1/
-55ï°C ï£ TA ï£ï +125ï°C
unless otherwise specified
tr
tf
ts
+OS
-OS
VOUT = 0 V to +200 mV,
AV = +1, RL = 1 kï,
VS = ï±15 V
VOUT = 0 V to -200 mV,
AV = +1, RL = 1 kï,
VS = ï±15 V
AV = -1 V/V, RL = 1 kï,
VS = ï±15 V, TA = +25ï°C,
10 V step at 0.1% of the
fixed value
AV = -1 V/V, RL = 1 kï,
VS = ï±15 V, TA = +25ï°C,
10 V step at 0.01% of the
fixed value
VOUT = 0 V to +200 mV,
AV = +1, RL = 1 kï,
VS = ï±15 V, TA = +25ï°C
VOUT = 0 V to -200 mV,
AV = +1, RL = 1 kï,
VS = ï±15 V, TA = +25ï°C
Group A Device
subgroups type
4,5,6
01
Limits 2/
Min Max
10
4,5,6
01
10
4
01
150
200
4
01
30
30
1/ Unless otherwise specified, for dc tests, RS ï¼ 100 ï, RL ï¾ 100 kï, VOUT = 0 V, and CL ï£ 10 pF.
Unless otherwise specified, for ac tests, AV = ±1 V/V, RL = 1 kâ¦, and CL ï£ 10 pF.
2/ The limiting terms "min" (minimum) and "max" (maximum) shall be considered to apply to magnitudes only.
Negative current shall be defined as conventional current flow out of a device terminal.
3/ This test is guaranteed by testing CMRR.
4/ If not tested, shall be guaranteed to the limits specified in table I herein.
5/ Quiescent power consumption is based on quiescent supply current test maximum (no load at the output).
6/ Slew rate test limits are guarantee after 5 minutes of warm-up.
7/ Full power bandwidth = SR / (2 x ï° x VPK).
8/ Rise and fall times measured between 10 percent and 90 percent point.
Unit
ns
ns
ns
%
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
B
5962-89647
SHEET
8
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