FXO-HC536R-125 Datasheet, PDF (5/15 Pages) List of Unclassifed Manufacturers – HCMOS 5 x 3.2mm 3.3V Oscillator

FXO-HC53 Series
Phase Noise
0 dBc
-10dBc
-20dBc
-30dBc
-40dBc
-50dBc
-60dBc
-70dBc
156.25MHz
62.5 MHz
-80dBc
-90dBc
-100dBc
-110dBc
-120dBc
-130dBc
-140dBc
-150dBc
-160dBc
10
100
Phase Noise Graph
(dBc / Hz) vs. offset frequency
Data Collected using HP 3048A
Three Frequencies from Jitter Tables
106.25 MHz
1k
10k
100k
Offset Frequency (10Hz to 40MHz)
62.5 MHz
1M
10M
156.25MHz
106.25 MHz
40M
Jitter is frequency dependent. Below are typical values at select frequencies.
Phase Jitter & Time Interval Error (TIE)
Frequency
Phase Jitter
(12kHz to 20MHz)
TIE
(Sigma of Jitter Distribution)
Units
62.5 MHz
0.93
2.8
pS RMS
106.25 MHz
0.86
3.2
pS RMS
125 MHz
0.75
156.25 MHz
0.77
2.7
pS RMS
3.3
pS RMS
Phase Jitter is integrated from HP3048 Phase Noise Measurement System; measured directly into 50 ohm input; V_DD = 3.3V.
TIE was measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software; V_DD = 3.3V.
Per MJSQ spec (Methodologies for Jitter and Signal Quality specifications)
Random & Deterministic Jitter Composition
Random (Rj) Deterministic (Dj)
Frequency
(pS RMS)
(pS P-P)
Total Jitter (Tj)
(14 x Rj) + Dj
62.5 MHz
1.28
6.8
25.1 pS
106.25 MHz
1.28
8.4
26.6 pS
125 MHz
1.20
8.0
156.25 MHz
1.27
8.6
25.2 pS
26.6 pS
Rj and Dj, measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software.
Per MJSQ spec (Methodologies for Jitter and Signal Quality specifications)
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