5962-9321401MEA Datasheet, PDF (5/11 Pages) List of Unclassifed Manufacturers – MICROCIRCUIT, LINEAR, PRECISION ±10 V VOLTAGE REFERENCE, MONOLITHIC SILICON

Test
Output voltage error,
+10 V outputs
-10 V outputs
Tracking mode error
Output voltage drift
Line regulation 2/
Load regulation
Supply current
Supply current
TABLE I. Electrical performance characteristics.
Symbol
V_OE
Conditions 1/
-55°C ≤ T_A ≤ +125°C
unless otherwise specified
V_OUT = +10 V, -10 V
Group A Device
subgroups type
1
01
Limits
Min Max
±5
Unit
mV
V_SYM
V_OUT = +10 V, -10 V
D_VO / D_T V_OUT = +10 V, -10 V
VR_LINE
V_OUT = +10 V, -10 V
VR_LOAD
V_OUT = +10 V,
0 mA ≤ I_OUT ≤ 10 mA
V_OUT = -10 V,
-10 mA ≤ I_OUT ≤ 0 mA
+I_S
V_OUT = +10 V, -10 V
-I_S
V_OUT = +10 V, -10 V
1
01
1,2,3
01
1,2,3
01
1,2,3
01
1,2,3
01
1,2,3
01
±3 mV
±6 ppm/°C
±200 µV/V
50 µV/mA
50
+12 mA
-12 mA
1/ +V_S = 15 V, -V_S = -15 V, A3 IN is connected to V_HIGH, A4 IN is connected to V_LOW. Test using the low duty cycle test
method at the junction temperature typically predicated for the specified steady-state power-on condition. Functionality
tests are performed at the cold start temperature of -55°C.
2/ 13.5 V ≤ +V_S ≤ 18 V, -13.5 ≤ -V_S ≤ -18 V.
4. VERIFICATION
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan
shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in
accordance with MIL-PRF-38535, appendix A.
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted
on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in
accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
B
5962-93214
SHEET
5