FN5000110 Datasheet, PDF (3/3 Pages) List of Unclassifed Manufacturers – 3.3V CMOS Low Jitter XO

Test Circuit
Power
4
3
Supply
0.1μF
1
2
or
0.01μF
Output Enable / Disable Function
3.3V CMOS Low Jitter XO ^FN
FN Series Crystal Clock Oscillator (XO)
Legacy S1613 Series | 7.0 x 5.0mm
Test Point
15 pF
(Including probe
and fixture
capacitance)
Reflow Soldering Profile
As per IPC/JEDEC J-STD-020C
1 to 3°C/sec max
260
217
Peak 260°C for 10 sec max
1 to 3°C/sec
60 to 90 sec
Time
4 to 6 minutes max
Reliability Test Ratings
This product is rated to meet the following test conditions:
Type
Parameter
Mechanical
Shock
Mechanical
Solderability
Mechanical
Terminal strength
Mechanical
Gross leak
Mechanical
Fine leak
Mechanical
Solvent resistance
Environmental
Thermal shock
Environmental
Moisture resistance
Environmental
Vibration
Environmental
Resistance to soldering heat
Test Condition
MIL-STD-883, Method 2002, Condition B
JESD22-B102-D Method 2 (Preconditioning E)
MIL-STD-883, Method 2004, Condition D
MIL-STD-883, Method 1014, Condition C
MIL-STD-883, Method 1014, Condition A2 (R₁ = 2x10^-8 atm cc/s)
MIL-STD-202, Method 215
MIL-STD-883, Method 1011, Condition A
MIL-STD-883, Method 1004
MIL-STD-883, Method 2007, Condition A
J-STD-020C Table 5-2 Pb-free devices (2 cycles max)
SaRonix-eCera™ is a Pericom® Semiconductor company • US: [phone] TW: [phone] • www.saronix-ecera.com
All specifications are subject to change without notice. FN 3.3 REV2008_DEC29_01.4
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