JM38510 Datasheet, PDF (11/14 Pages) List of Unclassifed Manufacturers – MICROCIRCUIT, LINEAR, RADIATION HARDENED, LOW NOISE, PRECISION OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

TABLE IIA. Electrical test requirements.
Test requirements
Interim electrical
parameters (see 4.2)
Final electrical
parameters (see 4.2)
Group A test
requirements (see 4.4)
Group C end-point electrical
parameters (see 4.4)
Group D end-point electrical
parameters (see 4.4)
Group E end-point electrical
parameters (see 4.4)
Subgroups
(in accordance with
MIL-STD-883,
method 5005, table I)
Device
class M
1
Subgroups
(in accordance with
MIL-PRF-38535, table III)
Device
class Q
1
Device
class V
1
1,2,3,4 1/
1,2,3,4 1/
1,2,3,4 1/ 2/
1,2,3,4
1,2,3,4
1,2,3,4
1
1
1 2/
1
1
1
---
---
1,4
1/ PDA applies to subgroup 1.
2/ Delta limits as specified in table IIB shall be required where specified, and the delta limits
shall be completed with reference to the zero hour electrical parameters (see table I).
TABLE IIB. Burn-in and operating life test delta parameters. T_A = +25C. 1/ 2/
Parameter Device type
V_IO
02, 03
I_IB
02, 03
Min
-135
-70
Limit
Max
+135
+70
1/ Deltas are performed at room temperature.
2/ 240 hour burn-in and 1,000 hour operating group C life test.
Delta
75 V
10 nA
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups
A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein. Quality conformance inspection for
device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed
for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections
(see 4.4.1 through 4.4.4).
4.4.1 Group A inspection.
a. Tests shall be as specified in table IIA herein.
b. Subgroups 5, 6, 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
E
5962-94680
SHEET
11