TSLW1401R Datasheet, PDF (4/10 Pages) List of Unclassifed Manufacturers – EXTENDED TEMPERATURE 128 x 1 LINEAR SENSOR ARRAY WITH HOLD

TSLW1401R
EXTENDED TEMPERATURE
128 × 1 LINEAR SENSOR ARRAY WITH HOLD
TAOS044 – NOVEMBER 2002
REl_L^e=ct3ri3c0alΩ^{C, hEa}_e^{r=ac1t2e.r5is}µ^{tiWcs/camt 2fc}(^lu^ocn^kle=s1s
MHz, V_DD = 5 V, T_A = 25°C, λ_p =
otherwise noted) (see Note 2)
640
nm,
t_int
=
5
ms,
PARAMETER
TEST CONDITIONS
MIN TYP MAX UNIT
V_out
V_drk
PRNU
Analog output voltage (white, average over 128 pixels)
Analog output voltage (dark, average over 128 pixels)
Pixel response nonuniformity
See Note 3
E_e = 0
See Note 4
1.6
2
2.4
V
0
0.1
0.2
V
±4% ±7.5%
Nonlinearity of analog output voltage
See Note 5
±0.4%
FS
Output noise voltage
See Note 6
1
mVrms
R_e
Responsivity
See Note 7
20
30
40
V/
(µJ/cm²)
V_sat Analog output saturation voltage
SE
Saturation exposure
DSNU Dark signal nonuniformity
IL
Image lag
V_DD = 5 V, R_L = 330 Ω
V_DD = 3 V, R_L = 330 Ω
V_DD = 5 V, See Note 8
V_DD = 3 V, See Note 8
All pixels, E_e = 0, See Note 9
See Note 10
4.5
4.8
2.5
2.8
155
89
0.02
0.5%
V
nJ/cm²
0.05
V
I_DD
Supply current
V_DD = 5 V, E_e = 0
V_DD = 3 V, E_e = 0
2.8
4.5
mA
2.6
4.5
I_IH
High-level input current
V_I = V_DD
1 µA
I_IL
Low-level input current
V_I = 0
1 µA
C_i
Input capacitance
5
pF
NOTES: 2. All measurements made with a 0.1 µF capacitor connected between V_DD and ground.
3. The array is uniformly illuminated with a diffused LED source having a peak wavelength of 640 nm.
4. PRNU is the maximum difference between the voltage from any single pixel and the average output voltage from all pixels of the
device under test when the array is uniformly illuminated at the white irradiance level. PRNU includes DSNU.
5. Nonlinearity is defined as the maximum deviation from a best-fit straight line over the dark-to-white irradiance levels, as a percent
of analog output voltage (white).
6. RMS noise is the standard deviation of a single-pixel output under constant illumination as observed over a 5-second period.
7. R_e(min) = [V_out(min) – V_drk(max)] ÷ (E_e × t_int)
8. SE(min) = [V_sat(min) – V_drk(min)] × 〈E_e × t_int) ÷ [V_out(max) – V_drk(min)]
9. DSNU is the difference between the maximum and minimum output voltage for all pixels in the absence of illumination.
10. Image lag is a residual signal left in a pixel from a previous exposure. It is defined as a percent of white-level signal remaining after
a pixel is exposed to a white condition followed by a dark condition:
IL
+
Vout _(IL) * Vdrk
Vout _(white) * Vdrk
100
Timing Requirements (see Figure 1 and Figure 2)
t_su(SI) Setup time, serial input (see Note 11)
t_h(SI) Hold time, serial input (see Note 11 and Note 12)
t_w
Pulse duration, clock high or low
t_r, t_f Input transition (rise and fall) time
NOTES: 11. Input pulses have the following characteristics: t_r = 6 ns, t_f = 6 ns.
12. SI must go low before the rising edge of the next clock pulse.
MIN NOM MAX UNIT
20
ns
0
ns
50
ns
0
500 ns
Dynamic Characteristics over recommended ranges of supply voltage and operating free-air
temperature
PARAMETER
t_s
Analog output settling time to ±1%
TEST CONDITIONS
R_L = 330 Ω, C_L = 10 pF
MIN TYP MAX UNIT
120
ns
Copyright E 2002, TAOS Inc.
t
The LUMENOLOGYr Company
t
4
www.taosinc.com