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WSF128K32 Datasheet, PDF (3/12 Pages) List of Unclassifed Manufacturers – 128K x 32 SRAM/FLASH MODULE
White Electronic Designs WSF128K32-XH2X
SRAM AC CHARACTERISTICS
(VCC = 5.0V, TA = -55°C TO +125°C)
Parameter
Symbol
Read Cycle
Read Cycle Time
tRC
Address Access Time
tAA
Output Hold from Address Change tOH
Chip Select Access Time
tACS
Output Enable to Output Valid
tOE
Chip Select to Output in Low Z
tCLZ1
Output Enable to Output in Low Z tOLZ1
Chip Disable to Output in High Z tCHZ1
Output Disable to Output in High Z tOHZ1
-25
Min
Max
25
25
0
25
15
3
0
12
12
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
1. This parameter is guaranteed by design but not tested.
SRAM AC CHARACTERISTICS
(VCC = 5.0V, TA = -55°C TO +125°C)
Parameter
Write Cycle
Write Cycle Time
Chip Select to End of Write
Address Valid to End of Write
Data Valid to End of Write
Write Pulse Width
Address Setup Time
Address Hold Time
Output Active from End of Write
Write Enable to Output in High Z
Data Hold from Write Time
Symbol
tWC
tCW
tAW
tDW
tWP
tAS
tAH
tOW1
tWHZ1
tDH
-25
Min Max
25
20
20
15
20
0
0
3
15
0
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
1. This parameter is guaranteed by design but not tested.
FIG. 2 AC TEST CIRCUIT
I OL
Current Source
D.U.T.
Ceff = 50 pf
I OH
Current Source
VZ ≈ 1.5V
(Bipolar Supply)
AC TEST CONDITIONS
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0 V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
Notes:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75 W.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
3
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