MX29LV033C Datasheet, PDF (50/57 Pages) List of Unclassifed Manufacturers – 32M-BIT COMSEQUAL SECTOR FLASH MEMORY

MX29LV033C
ERASE AND PROGRAMMING PERFORMANCE (1)
PARAMETER
Sector Erase Time
Chip Erase Time
Byte Programming Time
Chip Programming Time
Erase/Program Cycles
MIN.
100,000
LIMITS
TYP.(2)
0.7
35
7
36
Note: 1.Not 100% Tested, Excludes external system level over head.
2.Typical values measured at 25° C,3.3V.
MAX.
15
50
210
108
UNITS
sec
sec
us
sec
Cycles
LATCH-UP CHARACTERISTICS
Input Voltage with respect to GND on all pins except I/O pins
Input Voltage with respect to GND on all I/O pins
Current
Includes all pins except Vcc. Test conditions: Vcc = 5.0V, one pin at a time.
MIN.
-1.0V
-1.0V
-100mA
MAX.
13.5V
Vcc + 1.0V
+100mA
TSOP PIN CAPACITANCE
Parameter Symbol
CIN
COUT
CIN2
Parameter Description
Input Capacitance
Output Capacitance
Control Pin Capacitance
Notes:
1. Sampled, not 100% tested.
2.Test conditions TA=25° C, f=1.0MHz
Test Set
VIN=0
VOUT=0
VIN=0
TYP
MAX
UNIT
6
7.5
pF
8.5
12
pF
7.5
9
pF
DATA RETENTION
Parameter
Minimum Pattern Data Retention Time
P/N:PM1189
Test Conditions
150°C
125°C
50
Min
Unit
10
Years
20
Years
REV. 0.02, JUL. 21, 2005