 English |
|
|
|
|
|
|
|
| RG2012P-2491-B-T5 Datasheet, PDF (2/2 Pages) List of Unclassifed Manufacturers – Metal thin film chip resistors (Ultra-precision) | |||
| |||
| ◁ |
Components
Reliability characteristics
Item
Short time Overload
Load Life
Moisture load life
Temperature Cycle
High temperature Exposure
Test Method
Appled voltage : 2.5 times. Test duration: 5 seconds. (When maximun
operationg voltage: 2 times or less)
Test temperature : 85â (When high voltage : 70â ). Applied voltage :
rated voltage. Repeat 1000 hours as follow : 90 mins on/30mins off.
Test condition: 85â, 85% RH. Applied power : 1/10 rated power.
Repeat 1000 hours as follow : 90 mins on/30mins off.
Repeat 1000 cycle as follow :
â55â (30 min.)/Room Temp.(2 min.) / +125â (30min.)/Room Temp.(2min.)
+155 â for 1000 hours with no load
Specification: drift limits for each power rating
Low
Regular
High
(Typical)
â¦47Ω â§47Ω â¦47Ω â§47Ω â¦47Ω â§47Ω
±0.10% ±0.05% ±0.10% ±0.05% 㼠±0.10% ±ï¼0.01%ï¼
±0.25% ±0.10% ±0.50% ±0.25% 㼠±0.50% ±ï¼0.01%ï¼
±0.25% ±0.10% ±0.50% ±0.25% 㼠±0.50% ±ï¼0.05%ï¼
±0.25% ±0.10% ±0.25% ±0.10% 㼠±0.10% ±ï¼0.01%ï¼
±0.25% ±0.10% ±0.25% ±0.10% 㼠±0.10% ±ï¼0.01%ï¼
10000 hour reliability test data
Life test
)JHIUFNQFSBUVSFMJGFUFTÊ¢U ËÊ£
4 B N Q M FÉ¿3(TFSJFT
5FTUDPOEJUJPOTÉ¿ 5FNQFSBUVSFË
3BUFEWPMUBHFNJOPONJOPâ
3BUFEQPXFS 8
O
ʵ
ʵ
ʵ
ʵ
ʵ
LÐ
LÐ
LÐ
LÐ
LÐ
5FTU%VSBUJPOÊ¢IÊ£
Temperature cycle test
5FNQFSBUVSFDZDMF
4 B N Q M FÉ¿3(TFSJFT
5FTUDPOEJUJPOTÉ¿ ʵËÊ¢NJOÊ£Ë SPPNUFNQÊ¢ NJOÊ£Ë
Ê´ËÊ¢NJOÊ£Ë SPPNUFNQÊ¢ NJOÊ£
O
ʵ
ʵ
ʵ
ʵ
ʵ
/VNCFSPGDZDMFT
LÐ
LÐ
High temperature high humidity bias test
)JHIUFNQFSBUVSFIJHIIVNJEJUZCJBTÊ¢5)#ËÊ£
4 B N Q M FÉ¿3(TFSJFT
5FTUDPOEJUJPOTÉ¿ 5FNQFSBUVSFË)VNJEJUZË3)
SBUFEQPXFSNJOPONJOPâ
3BUFEQPXFS 8
O
ʵ
ʵ
ʵ
ʵ
ʵ
LÐ
LÐ
LÐ
LÐ
LÐ
5FTU%VSBUJPOÊ¢IÊ£
High temperature exposure test
)JHIUFNQFSBUVSFFYQPTVSFÊ¢ËÊ£
4 B N Q M FÉ¿3(TFSJFT
5FTUDPOEJUJPOTÉ¿ 5FNQFSBUVSFË
O
ʵ
ʵ
ʵ
ʵ
ʵ
LÐ
LÐ
LÐ
LÐ
LÐ
5FTU%VSBUJPOÊ¢IÊ£
Power derating characteristics
)JHIQPXFSBQQMJDBUJPO
3FHVMBSQPXFSBQQMJDBUJPO
)JHIQSFDJTJPO
ʵ
"NCJFOUUFNQFSBUVSFË
1PXFSEFSBUJOHDVSWF
Part numbering system
RG ʪ/FXOBNFʫ 1608
Maximum pulse power limit
UZQF
UZQF
UZQF
UZQF
1VMTFEVSBUJPO TFDPOET
Test procedure
Voltage pulse is applied to the test
samples mounted on the test board.
After each pulse, resistance drift is
measured. Pulse voltage is increased
until the drift exceeds +/-0.5%. The
power at that voltage is defined as the
maximum pulse power.
N - 102 - B - T5
1BDLBHJOHÉ¿5Ê¢QDTÊ£5Ê¢QDTÊ£
3FTJTUBODFUPMFSBODF
3FTJTUBODFWBMVF
Ê¢&É¿EJHJU
&EJHJU
3(BMMEJHJUÊ£
5FNQFSBUVSFDPFâDJFOUPGSFTJTUBODF
1PXFSʢ#8ɼ$8ɼ&8ʣ
4J[F
4FSJFTDPEF
RGH ʪ0-%1/ʫ 1608 2C - N - 102 - B - T5
8
|
German
Russian
Spanish
Italian
Polish
Chinese
Japanese
Korean
French
Portuguese