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QA-1000HC Datasheet, PDF (2/6 Pages) List of Unclassifed Manufacturers – Full Featured Programmable Analog Supply Current Monitor
QA-1000HC
ELECTRICAL SPECIFICATIONS
Measured at VDUT=+5.00V, VCC= +12.0V, VEE= -12.0V, T=20°C
SYMBOL PARAMETER
CONDITION
MIN TYP MAX UNITS
Power Supply
VCC Positive Supply Voltage
VEE Negative Supply Voltage
ICCQ Quiescent Supply Current
IEEQ Quiescent Supply Current
Input Range
@ IDUT=0mA
@ IDUT=0mA
+11.5 +12 +16
V
-11.5 -12 -16
V
+12 +40
mA
-12 -40
mA
IDUT
VDUT
IVDUT
DUT Supply Current
DUT Supply Voltage (1)
Input Bias Current
0
2
A
-7.0
+7.0
V
2
µA
DC Accuracy
∆IDUT Resolution (2)
Measurement Offset
@ CL=100nF, f-3dB=50kHz
@ CL=100nF, f-3dB=500kHz
@ CL=100nF, f-3dB=5MHz
0.3
mARMS
1
mARMS
2
mARMS
2
5
mA
Gain error
0.1 0.5
%
I/V I/V Conversion Ratio
2.5
mV/mA
AC Characteristics
IDUT –3dB bandwidth
SR Slew Rate
THD Total Harmonic Distortion
@ CL=100nF, JP2,3=OFF
@ CL=100nF, JP2=ON, JP3=OFF
@ CL=100nF, JP2=OFF, JP3=ON
@ CL=100nF, JP2,3=OFF
@ CL=100nF
5000
500
50
TBD
TBD
kHz
kHz
kHz
V/µs
dB
DUT Output
IDUT DUT current
CL Loading Capacitance CL
Internal Resistance
-2
2
A
0
100
uF
Between DUT & VDUT
25
mΩ
DUT – VDUT voltage drop @ IDUT=2A
50
mV
(1) The VDUT pin must be permanently connected to a voltage source and must notbe left floating.
(2) Considering clean supplies and no external noise pick up at VDUT/DUT terminals such as switching noise from ATE power
supply.
ABSOLUTE MAXIMUM RATINGS
Parameter
With Respect To
Min
Max
Units
VCC
GND
-0.3
+18
V
VEE
GND
-18
+0.3
V
VDUT
GND
-0.3
10
V
IDUT
GND
-3
3
A
Operating Temperature Range
0
+70
°C
Storage Temperature
Lead Temperature (10sec) (1)
-40
+80
°C
+220
°C
(1) Manual soldering is recommended using standard eutectic Sn63Pb solder.
NOTE: Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a
stress rating only; functional operation of the device at these or other conditions above those indicated in the operational sections
of this specification is not implied. Exposure to absolute maximum ratings for extended periods may affect device reliability.
© Q-Star Test nv, 2003
Revision C - page 2 of 6
Due to continuous pursuit of innovation, the technical specifications listed are subject to change without notice.