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CB2012T2R2M Datasheet, PDF (11/16 Pages) List of Unclassifed Manufacturers – WOUND CHIP INDUCTORS
RELIABILITY DATAɹ
4/8
Specified Value
Item
LEM2520
LB2518
LB2016
LB2012
LB1608
LBC2518
LBC2016
LBC2012
CB2518
CB2016
CB2012
CBC3225
CBC2518
CBC2016
CBC2012
CBL2012
LBH1608
Test Methods and Remarks
14.Drop test
˚L/Lˠ
LEMÉ¿
WithinM5L
Drop test
No significant
Impact materialɿconcreta or vinyl tile
abnormality in
Heightɿ1m
appearance.
Total number of dropsɿ10 times
5
LEM2520
Accelerationɿ980m/sec2
Durationɿ6msec
Number of timesɿ6 sides P 3 times
Mounting methodɿSoldering onto printed board
f* Excluding 10NVR10g
RecoveryɿAt least 1 hr of recovery under
the standard condition after the
test, followed by the measure-
ment within 2 hrs.
15.Solderability
At least 90L of electrode
LEMÉ¿
Solder temperatureɿ230M5C
Durationɿ5M0.5sec. fLEM2520g
FiuxɿMethanol solution with 25L of
colophony
LBYLBCYCBYCBCYCBLYLBHÉ¿
Solder temperatureɿ230M5C
Durationɿ5M0.5sec
FiuxɿMethanol solution with 25L of
colophony
203