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EPD-150-0-2.5 Datasheet, PDF (1/2 Pages) EPIGAP optoelectronic GmbH – Photodiode
Photodiode
Preliminary
Wavelength
VUV
Type
Schottky Contact
EPD-150-0-2.5
6/21/2007
rev. 05/07
Technology
Case
GaP
TO-39 + sapphire window
chip location
± 0,1
9,90
Anode
13,5 ± 1,0
2,00 ± 0,05
sapphire
ELC-80
0,80 ± 0,05
45,00°
chip location
Description
Wide bandwidth and high sensitivity from VUV up
to the visible spectrum (150 nm - 550 nm),
mounted in hermetically sealed TO-39 package
with sapphire window
Applications
Medical engineering (dermatology), output check
of UV - lamps and oil or gas burner flame,
measurement and control of ecological
parameters, radiation control for a solarium, UV
water purification facilities
Miscellaneous Parameters
Tamb = 25°C, unless otherwise specified
Parameter
Active area
Temperature coefficient of ID
Operating temperature range
Storage temperature range
Acceptance angle at 50% Sλ
Test сonditions
Symbol
A
TC(ID)
Tamb
Tstg
ϕ
Value
4.8
7.0
-40 to +125
-40 to +125
120
Unit
mm²
%/K
°C
°C
deg.
Optical and Electrical Characteristics
Tamb = 25°C, unless otherwise specified
Parameter
Test conditions Symbol
Min
Typ
Breakdown voltage1)
IR = 10 µA
VR
5
Dark current
VR = 5 V
ID
15
Peak sensitivity wavelength
VR = 0 V
λp
440
Responsivity at λP
Sensitivity range at 1%
Spectral bandwidth at 50%
Shunt resistance
Noise equivalent power
Specific detectivity
VR = 0 V
Sλ
0.17
VR = 0 V
λmin, λmax
150
VR = 0 V
∆λ0.5
180
VR = 10 mV
RSH
80
100
λ = 440 nm
NEP
1.3x10-14
λ = 440 nm
D*
1.7x1013
Junction capacitance
VR = 0 V
CJ
1000
Switching time (RL = 50 Ω)
VR = 5 V
tr, tf
1/60
Photo current at λ = 254 nm1,2)
VR = 0 V
Ee = 1 mW/cm²
IPh
2.5
1)for information only
2)measured with Hg-LP-VUV/UV-emitter as radiation source
Note: All measurements carried out with EPIGAP equipment
Labeling
Type
Lot N°
RD (typ.) [GΩ]
EPD-150-0-2.5 EPIGAP Optoelektronik GmbH, D-12555 Berlin, Köpenicker Str.325 b, Haus 201
Tel.: +49-30-6576 2543, Fax : +49-30-6576 2545
Max
Unit
V
40
pA
nm
A/W
550
nm
nm
GΩ
W/ Hz
cm ⋅ Hz ⋅ W −1
pF
ns
µA
Quantity
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