AN5381 Datasheet, PDF (5/6 Pages) Dynex Semiconductor – Case Non-rupture

be degraded to below 200V. Only
then were the basic units
encapsulated in the ceramic
housings. Again, to try and produce
the worst case scenario, the failure
AN 5381
point was aligned with the gate
tube in the ceramic which might be
deemed to be the weakest point.
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