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ZXMN3A01F Datasheet, PDF (4/7 Pages) Zetex Semiconductors – 30V N-CHANNEL ENHANCEMENT MODE MOSFET
ZXMN3A01F
ELECTRICAL CHARACTERISTICS (at TA = 25°C unless otherwise stated).
PARAMETER
SYMBOL MIN. TYP. MAX. UNIT CONDITIONS.
STATIC
Drain-Source Breakdown Voltage
V(BR)DSS 30
V ID=250µA, VGS=0V
Zero Gate Voltage Drain Current
IDSS
0.5 µA VDS=30V, VGS=0V
Gate-Body Leakage
IGSS
100 nA VGS=Ϯ20V, VDS=0V
Gate-Source Threshold Voltage
VGS(th)
Static Drain-Source On-State Resistance RDS(on)
(1)
1
V ID=250µA, VDS= VGS
0.106 0.12
0.18
Ω VGS=10V, ID=2.5A
Ω VGS=4.5V, ID=2.0A
Forward Transconductance (1)(3)
gfs
3.5
S VDS=4.5V,ID=2.5A
DYNAMIC (3)
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
SWITCHING(2) (3)
Ciss
Coss
Crss
190
pF
VDS=25 V, VGS=0V,
38
pF f=1MHz
20
pF
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Gate Charge
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
SOURCE-DRAIN DIODE
td(on)
tr
td(off)
tf
Qg
Qg
Qgs
Qgd
1.7
ns
2.3
ns VDD =15V, ID=2.5A
6.6
ns RG(6.0Ω, VGS=10V
2.9
ns
2.3
nC VDS=15V,VGS=5V,
ID=2.5A
3.9
nC
VDS=15V,VGS=10V,
0.6
nC ID=2.5A
0.9
nC
Diode Forward Voltage (1)
Reverse Recovery Time (3)
Reverse Recovery Charge (3)
VSD
trr
Qrr
0.85 0.95
17.7
13.0
V TJ=25°C, IS=1.7A,
VGS=0V
ns TJ=25°C, IF=2.5A,
di/dt= 100A/µs
nC
NOTES
(1) Measured under pulsed conditions. Width=300µs. Duty cycle ≤ 2% .
(2) Switching characteristics are independent of operating junction temperature.
(3) For design aid only, not subject to production testing.
ISSUE 2 - JULY 2002
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