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ZXMN10A25G Datasheet, PDF (4/8 Pages) Zetex Semiconductors – 100V SOT223 N-channel enhancement mode MOSFET | |||
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ZXMN10A25G
Electrical characteristics (at Tamb = 25°C unless otherwise stated)
Parameter
Symbol
Static
Drain-source breakdown voltage V(BR)DSS
Zero gate voltage drain current IDSS
Gate-body leakage
IGSS
Gate-source threshold voltage VGS(th)
Static drain-source on-state
resistance (*)
RDS(on)
Forward transconductance(*)(â¡)
Dynamic(â¡)
Input capacitance
Output capacitance
Reverse transfer capacitance
Switching (â ) (â¡)
Turn-on-delay time
Rise time
Turn-off delay time
Fall time
Gate charge
gfs
Ciss
Coss
Crss
td(on)
tr
td(off)
tf
Qg
Total gate charge
Qg
Gate-source charge
Qgs
Gate drain charge
Qgd
Source-drain diode
Diode forward voltage(*)
VSD
Reverse recovery time(â¡)
trr
Reverse recovery charge(â¡)
Qrr
Min.
100
2.0
Typ. Max. Unit Conditions
V ID= 250â®A, VGS=0V
0.5 â®A VDS= 100V, VGS=0V
100 nA VGS=±20V, VDS=0V
4.0
V ID= 250â®A, VDS=VGS
0.125 â VGS= 10V, ID= 2.9A
0.150 â VGS= 6V, ID = 2.6A
7.3
S VDS= 15V, ID= 2.9A
859
pF VDS= 50V, VGS=0V
57
pF f=1MHz
33
pF
4.9
ns VDD= 50V, ID= 1A
3.7
ns RGâ
6.0â, VGS= 10V
18
ns
9.4
ns
9.6
nC VDS= 50V, VGS= 5V
ID= 2.9A
17
nC VDS= 50V, VGS= 10V
3.8
nC ID= 2.9A
5.4
nC
0.85 0.95
40.5
62
V Tj=25°C, IS= 4A,
VGS=0V
ns Tj=25°C, IS= 2.9A,
nC di/dt=100A/â®s
NOTES:
(*) Measured under pulsed conditions. Pulse width Õ
300â®s; duty cycle Õ
2%.
(â ) Switching characteristics are independent of operating junction temperature.
(â¡) For design aid only, not subject to production testing.
Issue 1 - July 2006
4
© Zetex Semiconductors plc 2006
www.zetex.com
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