74HC86 Datasheet, PDF (3/9 Pages) NXP Semiconductors – Quad 2-input EXCLUSIVE-OR gate

74HC86
Absolute Maximum Ratings (Note 4) (@T_A = +25°C, unless otherwise specified.)
Symbol
ESD HBM
ESD CDM
Description
Human Body Model ESD Protection
Charged Device Model ESD Protection
Rating
Unit
2
KV
1
KV
ESD MM
Machine Model ESD Protection
200
V
V_CC
V_I
I_IK
I_OK
I_O
I_CC
I_GND
T_J
T_STG
P_TOT
Supply Voltage Range
Input Voltage Range (Note 5)
Input Clamp Current V_I < -0.5V or Vi > V_CC +0.5V
Output Clamp Current V_O < -0.5V or V_O > V_CC +0.5V
Continuous output current -0.5V < V_O V_CC +0.5V
Continuous Current Through Vcc
Continuous Current Through GND
Operating Junction Temperature
Storage Temperature
Total Power Dissipation
-0.5 to +7.0
V
-0.5 to +7.0
V
±20
mA
±20
mA
+/- 25
mA
50
mA
-50
mA
-40 to +150
°C
-65 to +150
°C
500
mW
Notes:
4. Stresses beyond the absolute maximum may result in immediate failure or reduced reliability. These are stress values and device operation should
be within recommend values.
5. Input Voltage cannot exceed V_CC to the extent the Maximum clamp current is exceeded.
Recommended Operating Conditions (Note 6) (@T_A = +25°C, unless otherwise specified.)
Symbol
Parameter
Conditions
Min
V_CC
Supply Voltage
2.0
V_I
Input Voltage
0
V_O
Output Voltage
0
V_CC = 2.0V
Δt/ΔV Input Transition Rise or Fall Rate
V_CC = 4.5V
V_CC = 6.0V
T_A
Operating Free-Air Temperature
-40
Note: 6. Unused inputs should be held at V_CC or Ground.
Max
6.0
V_CC
V_CC
625
140
85
+125
Unit
V
V
V
ns/V
°C
74HC86
Document number: DS35325 Rev. 3 - 2
3 of 9
www.diodes.com
January 2013
© Diodes Incorporated