74AHCT1G08 Datasheet, PDF (3/8 Pages) NXP Semiconductors – 2-input AND gate

74AHCT1G08
SINGLE 2 INPUT POSITIVE AND GATE
Absolute Maximum Ratings (Note 2)
Symbol
Description
Rating
Unit
ESD HBM Human Body Model ESD Protection
2
KV
ESD CDM Charged Device Model ESD Protection
1
KV
ESD MM
Machine Model ESD Protection
200
V
V_CC
Supply Voltage Range
-0.5 to 6.5
V
V_I
Input Voltage Range
-0.5 to 6.5
V
V_O
Voltage applied to output in high or low state
-0.5 to V_CC +0.5
V
I_IK
Input Clamp Current V_I<0
-20
mA
I_OK
Output Clamp Current (V_O < 0 or V_O > V_CC)
±20
mA
I_O
Continuous output current (V_O = 0 to V_CC)
±25
mA
I_CC
Continuous current through V_CC
50
mA
I_GND
Continuous current through GND
-50
mA
T_J
Operating Junction Temperature
-40 to 150
°C
T_STG
Storage Temperature
-65 to 150
°C
Notes: 2. Stresses beyond the absolute maximum may result in immediate failure or reduced reliability. These are stress values and device operation should be
within recommend values.
Recommended Operating Conditions (Note 3)
Symbol
V_CC
V_IH
V_IL
V_I
V_O
I_OH
I_OL
Δt/ΔV
T_A
Operating Voltage
High-level Input Voltage
Low-level input voltage
Input Voltage
Output Voltage
High-level output current
Low-level output current
Input transition rise or fall
rate
Operating free-air
temperature
Parameter
Notes: 3. Unused inputs should be held at VCC or Ground.
Min
Max
Unit
4.5
5.5
V
2.0
V
0.8
V
0
5.5
V
0
V_CC
V
-8
mA
8
mA
20
ns/V
-40
125
ºC
74AHCT1G08
Document number: DS35182 Rev. 1 - 2
3 of 8
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May 2011
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