74AHC1G09 Datasheet, PDF (2/9 Pages) NXP Semiconductors – 2-input AND gate with open-drain output

74AHC1G09
Logic Diagram
1
A
B2
4
Y
Functional Table
Inputs
A
B
H
H
L
X
X
L
Output
Y
Z
L
L
Absolute Maximum Ratings (Note 4) (@T_A = +25°C, unless otherwise specified.)
Symbol
ESD HBM
ESD CDM
ESD MM
Parameter
Human Body Model ESD Protection
Charged Device Model ESD Protection
Machine Model ESD Protection
Rating
Unit
2
KV
1
KV
200
V
V_CC
V_I
V_O
I_IK
I_OK
I_O
I_CC
I_GND
T_J
T_STG
Supply Voltage Range
Input Voltage Range
Voltage applied to output in high or low state
Input Clamp Current V_I < 0
Output Clamp Current (V_O < 0 or V_O > V_CC)
Continuous output current (V_O = 0 to V_CC)
Continuous current through V_CC
Continuous current through GND
Operating Junction Temperature
Storage Temperature
-0.5 to 6.5
V
-0.5 to 6.5
V
-0.5 to V_CC +0.5
V
-20
mA
±20
mA
±25
mA
50
mA
-50
mA
-40 to +150
°C
-65 to +150
°C
Note:
4. Stresses beyond the absolute maximum may result in immediate failure or reduced reliability. These are stress values and device operation should be
within recommend values.
74AHC1G09
Document number: DS35735 Rev. 2 - 2
2 of 9
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March 2013
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