BAS40W Datasheet, PDF (1/3 Pages) NXP Semiconductors – Schottky barrier double diodes

BAS40W/-04/-05/-06
SURFACE MOUNT SCHOTTKY BARRIER DIODE
Features
· Low Forward Voltage Drop
· Fast Switching
· Ultra-Small Surface Mount Package
· PN Junction Guard Ring for Transient and ESD
Protection
Mechanical Data
A
C
BC
SOT-323
Dim Min Max
A
0.25 0.40
B
1.15 1.35
C
2.00 2.20
D
0.65 Nominal
· Case: SOT-323, Molded Plastic
B
E
G
· Case Material - UL Flammability Rating
H
Classification 94V-0
· Moisture sensitivity: Level 1 per J-STD-020A ^K
M
· Terminals: Solderable per MIL-STD-202,
Method 208
J
DF
L
· Polarity: See Diagrams Below
· Marking: See Diagrams Below &Page 3
· Weight: 0.006 grams (approx.)
E
0.30 0.40
G
1.20 1.40
H
1.80 2.20
J
0.0 0.10
K
0.90 1.00
L
0.25 0.40
M
0.10 0.18
a
0°
8°
TOP VIEW
All Dimensions in mm
BAS40W Marking: K43
BAS40W-04 Marking: K44
BAS40W-05 Marking: K45
BAS40W-06 Marking: K46
Maximum Ratings ^{@ T}A ^{= 25°C unless otherwise specified}
Characteristic
Peak Repetitive Reverse Voltage
Working Peak Reverse Voltage
DC Blocking Voltage
RMS Reverse Voltage
Forward Continuous Current (Note 1)
Non-Repetitive Peak Forward Surge Current @ t = 1.0s
Power Dissipation (Note 1)
Thermal Resistance Junction to Ambient Air (Note 1)
Operating Temperature Range
Storage Temperature Range
Symbol
V_RRM
V_RWM
V_R
V_R(RMS)
I_FM
IFSM
P_d
RqJA
Tj
T_STG
Value
40
28
200
600
200
625
-55 to +125
-65 to +150
Unit
V
V
mA
mA
mW
°C/W
°C
°C
Electrical Characteristics ^{@ T}A ^{= 25°C unless otherwise specified}
Characteristic
Symbol
Min
Max
Unit
Test Condition
Reverse Breakdown Voltage (Note 2)
V(BR)R
40
¾
V
IR = 10mA
Forward Voltage (Note 2)
VF
¾
380
1000
mV
IF = 1.0mA, tp < 300ms
mV
I_F = 40mA, t_p < 300ms
Leakage Current (Note 2)
Total Capacitance
Reverse Recovery Time
I_R
¾
200
nA
VR = 30V
C_T
¾
5.0
pF
VR = 0, f = 1.0MHz
t_rr
¾
5.0
ns
I_F = I_R = 10mA,
Irr = 0.1 x IR, RL = 100W
Notes:
1. Device mounted on FR4 PC board with recommended pad layout, which can be found on our website at
http://www.diodes.com/datasheets/ap02001.pdf.
2. Short duration test pulse used to minimize self-heating effect.
DS30114 Rev. 8 - 2
1 of 3
BAS40W/-04/-05/-06
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