3D3314 Datasheet, PDF (5/5 Pages) Data Delay Devices, Inc. – MONOLITHIC QUAD FIXED DELAY LINE (SERIES 3D3314)

3D3314
SILICON DELAY LINE AUTOMATED TESTING
TEST CONDITIONS
INPUT:
Ambient Temperature: 25^oC ± 3^oC
Supply Voltage (Vcc): 3.3V ± 0.1V
Input Pulse:
High = 3.3V ± 0.1V
Low = 0.0V ± 0.1V
Source Impedance: 50Ω Max.
Rise/Fall Time:
3.0 ns Max. (measured
between 0.6V and 2.4V
)
Pulse Width:
Delay
PW_IN = 1.5 x Total
Period:
Delay
PER_IN = 3.0 x Total
Device
Under
Test
OUTPUT:
R_load:
C_load:
Threshold:
10KΩ
470Ω
10KΩ ± 10%
5pf ± 10%
1.5V (Rising & Falling)
Digital
Scope
5pf
NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.
COMPUTER
SYSTEM
PRINTER
PULSE
GENERATOR
OUT
TRIG
IN1 _{DEVICE UNDER}
IN2 _{TEST (DUT)}
IN3
IN4
OUT1
OUT2
OUT3
OUT4
REF
IN
DIGITAL SCOPE/
TRIG ^{TIME INTERVAL COUNTER}
Figure 2: Test Setup
t_RISE
PW_IN
PER_IN
t_FALL
INPUT
2.4
V_IH
2.4
SIGNAL
1.5
0.6
1.5
0.6
V_IL
t_PLH
t_PHL
OUTPUT
SIGNAL
V_OH
1.5
1.5
V_OL
Figure 3: Timing Diagram
Doc #00120
DATA DELAY DEVICES, INC.
5
6/12/02
3 Mt. Prospect Ave. Clifton, NJ 07013